Rotary kiln preheater thermal monitoring systems

ABSTRACT

A system for measuring temperatures of a preheater of a rotary kiln can include: at least one infrared imaging sensor for each level of the preheater; and an imaging analysis computer operably coupled with the at least one infrared imaging sensor of each level of the preheater. The imaging analysis computer can be configured to: obtain a 3D model of a preheater level of the preheater; obtain at least one infrared image of a fixed field of view of the preheater level of the preheater; analyze all pixels in the fixed field of view of the at least one infrared image for each pixel temperature; generate a 2D temperature model of the preheater level; overlaying the 2D temperature model over the 3D model to generate a virtual 3D preheater level temperature model; and providing a visual representation of the virtual 3D preheater level temperature model.

CROSS-REFERENCE TO RELATED APPLICATIONS

This patent application claims priority to U.S. Provisional ApplicationNo. 62/898,897 filed Sep. 11, 2019, which provisional is incorporatedherein by specific reference in its entirety.

BACKGROUND Field

The present invention relates to systems and methods for monitoringtemperatures of a preheater of a rotary kiln. In some aspects, thepresent invention relates to infrared imaging systems and methods fordetecting temperature variations at defined locations of a preheater ofa rotary kiln.

Description of Related Art

Generally, it is problematic to have a cement kiln with hot spots thatexceed allowable temperatures, even if for short durations. The hotspots cause degradation of the kiln, which requires periodic shut downfor maintenance and repair. These kilns are large structures (e.g., 4-5m diameter, 60-90 m length) and process a large amount of cement. Assuch, a shutdown is significantly costly due to costs to fix the kilnand the lost profits.

The kilns operate at significantly elevated temperatures of 800-1000°C., where the hottest location can be the bottom end from which theprocessed cement exits. However, temperatures can spike in discretelocations where brick may be prematurely degrading compared to otherareas. The increased temperatures can cause the brick in the discretelocations to warp, drop, and/or disintegrate at the hotspots furtherexacerbating the problem.

An example configuration of a kiln can include a tube formed of a steelcasing that houses an internal lining of brick. Support rollers hold atyre ring that is separated from the steel casing by blocks that arespaced apart from each other so that gaps are present between the tyreand blocks. The blocks can create areas where thermal dissipation fromthe steel casing may be limited due to thermal insulation or reducedthermal dissipation caused by covering the steel casing in the regionshaving the blocks. Additionally, the tyre circumferentially encloses theregion of the steel casing having the blocks and gaps therebetween sothat heat dissipation is further inhibited at the block region andconstricts heat flow at the gaps by limiting heat dissipation to theopenings on each end of the gap. The tyre assembly also inhibits thermalmonitoring of the steel casing and internal brick at the regionunderneath the tyre and blocks. As a result, the internal brick underthe tyre assembly may have undetectable thermal spikes that areunacceptable.

Additionally, a preheater for a rotary kiln may also be subject totemperature fluctuations. These preheater can have hot regions in one ormore locations, such as one or more preheater levels of the preheater.The preheater may also have regions that are cooler than desired. Thetemperatures of the preheater can have an impact on the operability ofthe rotary kiln.

Additionally, prior cooling systems for rotary kilns have included fansthat blow ambient air and sprayers that spray water on the steel casing.The fans only blow ambient air so the temperature reduction is limited,and the fans can be audibly unfavorable due to constant loudness of thefans. The water sprayers have shown benefits; however, the currentefficiency and difficulty of temperature control still is less thandesirable.

Therefore, it would be advantageous to be able to detect temperature andundesirable temperature deviations of a preheater of a rotary kiln.Moreover, it would be beneficial to be able to adjust the heating of thepreheater when regions thereof are too hot or too cool, in order tomaintain a suitable temperature so that the rotary kiln receivesmaterial or air that is adequately preheated in the preheater.

SUMMARY

In some embodiments, a system for detecting a temperature of a preheaterof a rotary kiln can include: at least one infrared imaging sensor foreach level of the preheater; and an imaging analysis computer operablycoupled with the at least one infrared imaging sensor. The imaginganalysis computer can be configured to control any infrared imagingsensor and acquire infrared images therefrom at any rate and in anyduration. The imaging analysis computer can be configured to analyze theinfrared images in order to: obtain at least one baseline infrared imageof a fixed field of view of each level of the preheater with or withoutan image of the rotary kiln; analyze all pixels in the fixed field ofview of each level of the preheater for the at least one baselineinfrared image for each pixel temperature; determine an acceptabletemperature range for each pixel in the fixed field of view for eachlevel of the preheater; obtain at least one subsequent infrared image ofthe fixed field of view of each level of the preheater; determine thetemperature for all pixels in the fixed field of view of the at leastone subsequent infrared image; determine whether the temperature foreach pixel in the at least one subsequent infrared image is within theacceptable temperature range for a particular level of the preheater;when the temperature is within the acceptable range for a particularlevel of the preheater, mark the pixel as normal; when the temperatureis greater than or less than the acceptable range for a particular levelof the preheater, mark the pixel as abnormal; and generate an alert ortemperature change protocol when one, two, or more adjacent pixels for aparticular level of the preheater are marked as abnormal and having atemperature outside of the acceptable temperature range in the fixedfield of view of the particular preheater.

In some embodiments, the system can be configured to obtain at least onebaseline infrared image of a fixed field of view of at least one levelof a preheater of a rotary kiln with a baseline temperature profile(e.g., allowable temperature profile) for the at least one level of thepreheater. Each level of the preheater of the kiln may include a uniquebaseline infrared image. The baseline image for each preheater of thekiln can be updated over time prior to a temperature spike ortemperature drop being detected on a surface of the housing of the levelof the preheater in the fixed field of view. The baseline image can bean image from an imaging sensor, or a historical composite of pixel datafrom a plurality of baseline images over time. This allows forcomparisons between images with a baseline temperature and images, suchas for a specific level of the preheater, that have a temperaturevariation outside of an allowable temperature variation range of thespecific level of the preheater. Otherwise, when the current image of aspecific preheater level has temperatures within the allowable range, itcan be a baseline image or used to form a baseline image along withother similar images (e.g., historical time period) for that specificpreheater level. The protocol continues until an image with atemperature spike or drop (e.g., variance outside allowable range) isobtained for a specific preheater level. A sequence of images at aspecific preheater level can be used to track temperature changes in thefield of view (FOV) of the images at the specific preheater level, whichallows a hotspot or cold region/level to be tracked. This also allowsspecific discrete locations of the preheater of the kiln to be monitoredwhile the kiln is rotating and operational, and thereby the entirety ofa circumferential area and all levels of the preheater can be monitoredand tracked for temperature monitoring purposes.

In some embodiments, the system can perform methods to analyze allpixels in the fixed field of view for changes from the at least onebaseline infrared image to at least one subsequent infrared image. Thechanges can be monitored for a specific level of the preheater of therotary kiln. The changes can be in the pixel data for each pixel, suchas changes in the pixel data that indicates changes in temperature ofsurfaces emitting the infrared light. That is, each pixel can beanalyzed by analyzing the pixel data in a subsequent image and comparingthat subsequent pixel data to the baseline pixel data. The analysis caninclude computationally processing the subsequent pixel data todetermine a pixel value, such as a temperature for that pixel. Thesubsequent pixel value is compared to the baseline pixel value. Thebaseline pixel value can be a range of suitable pixel values, and mayinclude a distribution of pixel values when the temperature is within asuitable range. When the subsequent pixel value of that pixel is withinan allowable range of the baseline pixel value, the subsequent pixelvalue does not identify a temperature spike or dropout. However, whenthe subsequent pixel value is outside the allowable range of thebaseline pixel value, then a determination is made as to whether or notthe subsequent pixel value is indicative of a temperature spike ortemperature drop being present. This protocol can be performed for eachof the discrete levels of the preheater of the kiln by monitoring thediscrete levels in a FOV of the imaging device of each level. That is,the temperature of a discrete level can be compared to the same discretelevel, such that all of the levels of the preheater can be monitored.Also, the temperatures of an image can be compared to a prior image sothat a discrete level can be monitored during operation, and so that ahotspot (e.g., hot level) or cold region (e.g., cold level) can beidentified at a discrete level compared to other levels of the preheaterand to historical temperatures of the specific level.

In some embodiments, the system can perform methods to identify realtime temperatures and real time variable differences in temperatures foreach pixel in the field of view between the at least one baselineinfrared image and the at least one subsequent infrared image. Thevariable difference can be determined by assessing changes in pixeltemperature value for a specific pixel (e.g., pixel location in thepixel array of the imaging device) from a baseline image to a subsequentimage. However, when the subsequent pixel temperature value is outside(e.g., hotter or cooler) the allowable range of the baseline pixeltemperature value, then a determination is made as to whether or not thesubsequent pixel value is indicative of a temperature spike ortemperature drop being present. The temperatures of the pixels can bemapped to the discrete levels of the preheater as the kiln rotates andis in operation, which allows for the same discrete location to becompared to itself, and also allows for comparison with of a firstdiscrete level with a different second level. In part, this is becausethe temperature of one level can directly impact the temperatures of theadjacent levels and the other levels of the preheater. Since eachinfrared camera is in a fixed location of a defined preheater level witha fixed field of view of that level, each pixel in the imagescorresponds to a specific location in the scene of the preheater level,which allows tracking each pixel over time and changes of the values ofeach pixel.

In some embodiments, the system can identify one or more first pixels inthe at least one subsequent infrared image having a first temperaturethat is greater than or less than an allowable temperature for the oneor more first pixels in the at least one subsequent infrared imagecompared to an allowable temperature for the one or more first pixels inthe at least one baseline infrared image of a particular preheaterlevel. Accordingly, an allowable temperature for each pixel can bedetermined, such as by recording the pixel data for each pixel (e.g.,raw pixel data or temperature pixel data) and determining a distributionof pixel temperatures for each pixel. The distribution of pixeltemperatures, based on historical pixel temperatures, can evolve as morepixel data is obtained for each pixel within the allowable temperaturerange. The distribution of pixel temperatures can be used to set athreshold temperature (e.g., maximum or minimum) for a pixeltemperature, where the threshold temperature sets an upper boundaryand/or lower boundary for the allowable temperature. The pixeltemperature for each pixel in the subsequent image can be compared tothe threshold temperature so as to be compared to the allowabletemperature. Then, pixels in the subsequent image having a pixeltemperature greater than the upper threshold temperature or lower thanthe lower threshold temperature are identified as being outside theallowable variable temperature range. The temperatures of the pixels canbe mapped to the discrete levels of the preheater as the kiln rotates,which allows for the same discrete level to be compared to itself, andalso allows for comparison with of a first discrete level with adifferent second discrete level of the preheater.

In some embodiments, the system can determine that there are one or morefirst pixels with a temperature spike/reduction based on the firsttemperature of the one or more first pixels being greater/lesser thanthe allowable temperature of the one or more first pixels in the fixedfield of view. As such, pixels having a pixel temperature that isgreater or lesser than the upper or lower threshold temperature can beidentified as being a temperature spike/reduction pixel due to havingthe first temperature that is greater/lesser than the allowabletemperature for each pixel. The pixels having a pixel temperature thatis outside (e.g., larger/smaller) than the allowable temperature rangecan be identified as being a hotspot or cool region.

In some embodiments, the system can generate an alert that identifies atemperature spike or cool region being present in the fixed field ofview of a level of the preheater. This is done when one or more pixelsare identified as having a temperature spike or temperature reduction,such as pixels that are adjacent and connected. When a temperature spikeis detected, instead of an alert or in addition thereto, the system maygenerate a cooling protocol to cool a hotspot. When a temperaturereduction is detected, instead of an alert or in addition thereof, thesystem may generate a heating protocol to heat the cool region, such asby increasing the temperature of the heat producers of the preheater orproviding increased heat flow from the heater of the rotary kiln. Whilea single pixel can be used to monitoring a temperature spike/reduction,it may be beneficial to have a group of connected pixels showingsubstantially the same temperature spike/reduction.

In some embodiments, the system can perform methods to generate an alertthat identifies the presence of a temperature spike (e.g., hotspot) ortemperature reduction (e.g., cool region) in real time for thetemperature of one or more pixel regions or any combination of these inthe fixed field of view. In some aspects, the imaging analysis computeris configured to provide the alert. In some aspects, the imaginganalysis computer is configured to provide the alert by actuating anaudible and/or visible indicator. In some aspects, the imaging analysiscomputer is configured to provide the alert by transmitting the alert toa remote device. In some aspects, the alert is an audible or visiblecommunication.

In some embodiments, a cooling system is provided and operably coupledwith the imaging analysis computer so that cooling can be implementedbased on hotspots on the preheater. The cooling system includes: asprayer controller (e.g., can be the same or different from the imageanalysis computer, such as being coupled therewith); a water source; apressurizing pump fluidly coupled with the water source and operablycoupled with the sprayer controller; a water supply system fluidlycoupled with the water source and pressurized by the pressurizing pump;at least one solenoid valve in the water supply system, wherein thesolenoid valve is operably coupled with the sprayer controller; and atleast one nozzle at an end of a spray line of the water supply system,wherein the at least one solenoid valve controls water sprayed from theat least one nozzle.

In some embodiments, the sprayer controller is configured to: obtainhotspot data for the preheater or the kiln; identify at least onehotspot to cool with a cooling water spray or being provided theidentify of at least one hotspot; determine a spraying protocol to coolthe identified at least one hotspot or receiving such a sprayingprotocol; implement the spraying protocol to cool the identified atleast one hotspot; obtain cooled temperature data for the at least onehotspot; determine whether a cooled temperature of the hotspot isgreater than the acceptable range; when the cooled temperature is withinthe acceptable range, terminate the spraying protocol; and when thecooled temperature is greater than the acceptable range, continue thespraying protocol.

In some embodiments, the sprayer controller or image analysis computeris configured to: identify a location and hotspot data of a specifichotspot on a specific preheater level; and determine a spraying protocolfor the specific preheater level hotspot based at least one of: a waterspray pressure; a distance of a specific water sprayer to the locationof the specific hotspot on a specific preheater level; time betweenactuating solenoid valve of the specific water sprayer and pressurizedwater reaching the nozzle; time between actuating solenoid valve of thespecific water sprayer and contacting resultant water spray on thelocation of the specific hotspot on the specific preheater level;duration of the location of the specific hotspot at the specificpreheater level being within a spray region on the preheater surface;duration of opening the solenoid valve; temperature of sprayed water;hottest temperature of the specific hotspot; temperature profile of thespecific hotspot at the specific preheater level; temperature gradientand area of the hotspot; temperature of sprayed water as it contacts thelocation of the specific hotspot (e.g., heated water or steam); when toinitiate spray by actuating the solenoid valve; when to terminate sprayby de-actuating the solenoid valve; position of nozzle of sprayerrelative to the location of the specific hotspot; area of hotspot; orarea of water spray on the preheater surface of a specific preheaterlevel.

In some embodiments, the methods are performed by the system in order toidentify cool regions or a preheater level that has an abnormally lowtemperature, and then increasing heating of the preheater to heat thecool region. In some aspects, this can include generating more heat witha heating device at a base of the preheater. In some aspects, this caninclude opening a damper or other air flow controlling device to allowmore heat through a tertiary kiln airduct to the preheater.

The foregoing summary is illustrative only and is not intended to be inany way limiting. In addition to the illustrative aspects, embodiments,and features described above, further aspects, embodiments, and featureswill become apparent by reference to the drawings and the followingdetailed description.

BRIEF DESCRIPTION OF THE FIGURES

The foregoing and following information as well as other features ofthis disclosure will become more fully apparent from the followingdescription and appended claims, taken in conjunction with theaccompanying drawings. Understanding that these drawings depict onlyseveral embodiments in accordance with the disclosure and are,therefore, not to be considered limiting of its scope, the disclosurewill be described with additional specificity and detail through use ofthe accompanying drawings.

FIG. 1 includes a schematic diagram for a system for monitoring a rotarykiln with a set of infrared imaging sensors and a cooling system forcooling hotspots or hot regions of the rotary kiln.

FIG. 1A. shows a cross-sectional side view of a portion of the tyresystem, so as to show the gap between the tyre ring, tyre blocks, andgap surface.

FIG. 1B shows a top view of the tyre gap with an imaging system.

FIG. 1C shows a cross-sectional view of a kiln with a temperaturemonitoring and control system.

FIG. 1D shows a top view of the tyre gap with a cooling system.

FIGS. 2-2A show a graphical user interface for monitoring imagesobtained from the imaging sensors.

FIG. 3 is a flow chart of a process of one exemplary embodiment of themethods for detecting hotspots that can be performed by the embodimentsof the systems disclosed herein.

FIG. 4 is a flowchart of a process of one exemplary embodiment of amethod for determining temperature values for pixels in an infraredimage that can be performed by the embodiments of the systems disclosedherein.

FIG. 4A is a flowchart of a process for generating a historicalvariation map.

FIG. 4B includes a flowchart of a process of generating a category mapfor the variation in temperatures for each pixel.

FIG. 4C includes a flowchart of a process of generating an alert orcooling command based on an abnormal region of pixels that areidentified as being a hotspot region.

FIG. 5A illustrates a method of detecting a hotspot.

FIG. 5B shows another method for detecting hotspots.

FIG. 5C show another method for determining regions devoid of hotspotsand regions having hotspots.

FIG. 6 shows an example computing device (e.g., a computer) that may bearranged in some embodiments to perform the methods (or portionsthereof) described herein.

FIG. 7 illustrates a method of cooling a hotspot.

FIG. 7A illustrates a method of activating a sprayer to cool a hotspot.

FIG. 8 includes a schematic representation of a cooling system that canbe used and controlled by an IR monitoring system.

FIG. 9 includes a schematic representation of an imaging sensor that hasa cooling housing.

FIG. 10A shows a schematic representation of a 2D model of a rotarykiln.

FIG. 10B shows a schematic representation of 3D models of components ofthe rotary kiln.

FIG. 10C shows a schematic representation of a 3D model of the assembledrotary kiln.

FIG. 11A shows a schematic representation of a preheater of a rotarykiln having a set of infrared imaging sensors.

FIG. 11B shows a schematic representation of a preheater of a rotarykiln having a set of infrared imaging sensors and a cooling system forcooling hotspots or hot regions of the preheater.

FIG. 12 includes a graph that shows a representation of temperature datafor a preheater that can be displayed to an operator of the preheaterand kiln.

The features of the figures can be arranged in accordance with at leastone of the embodiments described herein, and which arrangement may bemodified in accordance with the disclosure provided herein by one ofordinary skill in the art.

DETAILED DESCRIPTION

In the following detailed description, reference is made to theaccompanying drawings, which form a part hereof In the drawings, similarsymbols typically identify similar components, unless context dictatesotherwise. The illustrative embodiments described in the detaileddescription, drawings, and claims are not meant to be limiting. Otherembodiments may be utilized, and other changes may be made, withoutdeparting from the spirit or scope of the subject matter presentedherein. It will be readily understood that the aspects of the presentdisclosure, as generally described herein, and illustrated in thefigures, can be arranged, substituted, combined, separated, and designedin a wide variety of different configurations, all of which areexplicitly contemplated herein.

Generally, the present technology provides a system and method fordetecting temperatures and temperature variations of discrete locationsof a preheater and rotary kiln, especially in difficult surfaces tomeasure (e.g., between tyre blocks). The system can include at least oneinfrared imaging sensor and an imaging analysis computer operablycoupled with the at least one infrared imaging sensor. The imaginganalysis computer can be configured to control any infrared imagingsensor and acquire infrared images therefrom at any reasonable rate andin any duration. The imaging analysis computer can be configured toanalyze the infrared images in order to detect temperatures andtemperature variations in the preheater and kiln, as well as predictinternal temperatures of the brick layer of the rotary kiln. This can bedone for discrete locations that are tracked as the kiln rotates. Theimaging analysis computer can be configured to detect temperatures on asurface of a kiln casing in the gap underneath the tyre where it hasbeen traditionally difficult to detect such temperatures. That is, eachgap under the tyre can be monitored as the kiln rotates. Thetemperatures of the exposed surfaces of the kiln casing and hidden orcovered surfaces of the kiln casing can be recorded and used todetermine whether there are any hotspots or pixels with temperaturespikes. The hotspots can be tracked as the kiln rotates by comparinghotspot pixels from one image to the next image in a sequence, where thesequence can be analyzed to track movement across a field of view (FOV).Each level of a preheater can include an infrared imaging sensor tomonitor the temperature of each level.

Also, the system can include a water sprayer cooling system that can beoperably controlled by the same computing system that includes theimaging analysis computer. In some instances, a computer is both theimaging analysis computer and cooling system controller. In otherinstances, a PCL or controller area network bus (CAN bus) control modulecan be used as a controller. As such, the temperature data can beanalyzed to determine operation and spraying protocols for sprayingwater on the kiln casing and under the tyre in the gaps between the tyreblocks. The system can monitor temperatures of each individual gap inorder to determine whether or not the water sprayer cooling system iseffectively cooling and/or control the cooling system to maintain thedesired temperature profile around and under a tyre assembly.

In some embodiments, the system can include IR cameras of a monitoringsystem on one side of the rotary kiln and a water spray cooling systemon the other side of the rotary kiln. That is, for a roundcross-sectional area, the cameras and water sprayers are on oppositesides. Also, the cameras can be located outside of a steam/vapor regionso that steam generated from vaporization of the sprayed water does notimpede temperature monitoring. That is, the cameras and sprayers arepositioned so that none of the vapor generated by the water spray passesbetween the camera and the kiln.

In some embodiments, the temperature monitoring and cooling systems canbe provided to industrial plants with rotary kilns or other rotatingequipment that may need temperature monitoring and cooling. Such otherrotating equipment may or may not include components or regions that aredifficult to reach, which may be similar to the tyre assembly of therotary kiln. The systems can be adapted for IR imaging in difficult toview regions, and selective water spray configurations that do notresult in vapor that inhibits IR imaging and temperature analysis. Insome aspects, the sprayed water can be vapor when sprayed form thenozzle or be converted to vapor during transit from nozzle to surface ofkiln, where the high temperatures of the kiln heat the water spray toform a vapor spray. As a result, at least a portion or the entirety ofthe water contacting the surface of the kiln is vapor. The vapor iscooler than the temperature of the kiln, and thereby still cools thehotspots.

In some embodiments, the systems are provided with service plans so thatthe equipment is installed and maintained by a service provider. Theservice plans can include the automated controllers that analyze theimage data and/or provide the cooling instructions. The service planscan also include software for the temperature monitoring and/or cooling.The service plans can include transmittal of data to the serviceprovider for monitoring the temperatures (e.g., hotspots) and coolingsystem operation. The service plans can include automation of thesystems and providing graphical information about such operations of thesystem via display screens for operators to use. The service plan caninclude real time monitoring of all equipment operation and correctfunction. While the system may operation autonomously, the system can bemonitored and manually operated whether by an operator on site orremotely by the service provider.

The systems can provide improvements in monitoring under the tyreassembly (e.g., live rings and components thereof) by using the IRcameras aimed into the gaps between the tyre blocks to view surfacesunder the tyre assembly. This allows the system to capture IR images ofthe gaps for detection of temperature and temperature changes under thetyre assembly. The cooling system can also spray water into the tyregaps for improved cooling and temperature regulation under the tyreassembly. The appropriate placement of IR cameras and spray nozzles canprovide improved imaging and cooling without compromising temperaturemonitoring functions. A network of IR cameras and a network of spraynozzles can be configured and arranged for complete coverage of a tyreassembly, and possibly an entire kiln. In some aspects, the spraynozzles can be formed in a line that are linearly arranged along thelength of the kiln, and placed in a density such that the entire lengthof the kiln can be sprayed by the spray system.

In some embodiments, the cooling system provided herein can replace atraditional air flow cooling system that is used to cool kilns. However,the cooling system may be used to supplement an airflow cooling systemby selectively spraying water at hotspots (the nozzles can be movedaround when hotspots are detected) as well as fixed/movable nozzles forcooling the kiln under the tyre assembly.

The systems can provide for improved detection of hotspots under thetyre assembly by placement of the IR cameras, such as along alongitudinal axis of the kiln or of a tyre gap. The IR cameras caninclude an optical axis aligned with the longitudinal axis of the kiln;however, the optical axis can be at an angle, such as from 1 degree to45 degrees relative to the longitudinal axis, or 5-30 degrees, or 10-20degrees. The alignment is made so that the IR camera views a sufficientregion of the surface under the tyre ring.

The IR data can be analyzed for temperature monitoring and hotspotanalysis in real time. The real time functionality also allows formonitoring refractory wall thickness, such as by computations of wallthickness based on temperature profiles from the IR images. Changes intemperature in select regions, such as hotspots, can indicate a thinningof the refractory wall. The data can be analyzed so that a model of therefractory wall (e.g., brick) is obtained and updated in real time. Thesystem can also use the calculations and model to determine the currentwall thickness or integrity as well as make predictions in future wallthickness or predict rate of degradation of the refractory wall orspecific locations thereof, whether or not associated with a hotspot.This provides a history based prediction of both possible temperaturesand possible changes to the refractory brick wall, which can allow forforecasting a temperature profile and/or brick thickness profile atfuture timepoints, such as one or more days in the future, one or moreweeks in the future, or one or more months in the future. This can behelpful for maintenance planning. The cooling system can be used forextending the maintenance period so that the kiln can be in operationlonger without maintenance stoppages. The temperature of each preheatinglevel can similarly be monitored.

Changes in temperature can result in alerts being provided as well asautomatic operation of the water spray cooling system, such as ontohotspots. This can reduce hotspots, and may eliminate some hotspots orat least keep the temperature controlled to a desirable temperature.This can result in reducing the number of shutdown and startup cyclesrelated to kiln maintenance.

In some embodiments, the monitoring system can be an infrared monitoringsystem. The monitoring system can include a thermal imaging device (forexample, an infrared (IR) imaging device) and a processor that arecollectively configured to monitor and detect preheater and rotary kilnsurface temperatures at discrete locations, especially surfaces or areasof the kiln under the tyre assembly (e.g., in the gaps between the tyreblocks) and specific preheater levels. In some embodiments, themonitoring system may monitor a fixed field of view (FOV) to detecttemperatures on rotating hard surfaces, and to detect temperatures underthe rotating tyre assembly by tracking each individual tyre block and/ortyre gap. If a temperature spike is detected, the system is configuredto alert a user to the presence of the temperature spike (or a potentialkiln brick degradation region). For example, the alarm can be providedby actuating an indicator (e.g., a visual alarm or an audio alarm)and/or by communicating to one or more users via an electroniccommunication channel (e.g., text message, email, telephone call, etc.).In some embodiments, an IR monitoring system (or at least an IR detectorsensor or device) may be positioned to view under the tyre into the tyregaps, such as from each side of the tyre by viewing into both open endsof the tyre gaps.

In some embodiments, the alert can be tied to the cooling system, suchthat the cooling system is activated to initiate a cooling protocol uponthe conditions being met to generate the alert. The alert may beprovided by activation of the cooling system, or vice versa.

In some embodiments, an IR monitoring system may be used to detectwhether or not a cooling system is being effective, for example, bymonitoring specific regions being selectively cooled by a water spraycooling system, such as a specific tyre gap associated with a hotspot.The information can be used to modulate operation of the cooling system,such as in real time, to actively cool one or more discrete location ofthe kiln surface, which in turn can cool the underlying brick.

In some embodiments, a process (or a system) may start with a baselineIR image of the monitored field-of-view (FOV) that includes a rotatingtyre assembly. There may be a base line image for each rotationalposition of the kiln, so that each discrete location of the kiln may bemonitored during the rotation. This allows for the same discretelocation to be monitored per rotation for hotspot tracking purposes. Forexample, the IR camera can be aligned with a longitudinal axis of thekiln casing so that the FOV includes the gap, such as the surfaces ofthe steel casing, tyre blocks and tyre that define the gap. The IRcamera is stationary and images the gaps as they rotate by, and therebyeach gap can be identified and tracked (e.g., with a gap number) perrotation and during the rotation through the FOV. The process mayanalyze all pixels in the FOV for changes from the baseline image to asubsequent image in order to detect temperatures in real time. Thepixels of a hotspot are analyzed so that a region identified as ahotspot can be monitored so that a discrete location of the kiln can bemonitored as it rotates and the hotspot moves across the pixels. The FOVcan include a part or entire vessel of a preheater level as well as anyconnecting conduits between the different preheater levels.

Accordingly, the IR imaging system monitors temperatures in real time;however, it should be recognized that this temperature differencevariation may be different in different ambient conditions, differentgeographical locations, different humidity, or different times of theday, month, season or year. Also, each pixel is well characterized forthe rotating kiln so that each pixel corresponds with a specific regionof the rotating kiln, such as each pixel being related to surface datafor a surface of the rotary kiln in the pixel for the specific instancethe pixel was obtained. By collecting a series of images as the kilnrotates, the entirety of the kiln can be mapped and monitored forhotspots in real time. The well characterized pixel can have a range ofsuitable pixel values for each region of the casing that correspondswith that pixel when there is no hotspot at that casing region, so thatthe presence of a hotspot or temperature spike shows a significantlydifferent pixel value when that hotspot or temperature spike is imagedby that pixel. This allows the rotation to be taken into account fortemperature monitoring.

FIG. 1 includes a schematic diagram for a system 100 for monitoring arotary kiln 102 with a set of infrared imaging sensors 104 arranged formonitoring external kiln surfaces 106, such as tyre gap surfaces 108.The infrared imaging sensors 104 can be located relative to the tyregaps 110, so as to view into the tyre gaps 110 (e.g., under the tyrering 126) from each tyre gap opening 112, which can cover a largepercentage of the tyre gap surface 108, such 100%, 95%, 90%, 80%, 75%,50%, 40%, 25% or the like. The system 100 also includes an imageanalysis computer 114 operably coupled to the set of infrared imagingsensors 104 through a network 116 (e.g., wired, wireless, optical or anynetwork) represented by the dashed box. This allows for the infraredimaging sensors 104 to send infrared image data over the network 116 tothe image analysis computer 114 for analysis.

Generally, the kiln 102 can include the kiln casing 120 housing thebrick lining 122. The tyre assembly 124 can include the tyre ring 126and tyre blocks 128 that define the tyre gaps 110. The gap surface 108can include a region of the kiln surface 106 and the side surfaces ofthe tyre blocks 128, and optionally an under surface of the tyre ring126. However, the imaging sensors 104 may preferentially view thesurfaces of the casing 120 and tyre blocks 128 because hotspots are morelikely under these features, where the inner surface of the tyre ring126 may not need to be monitored because it is unlikely for any hotspotsto be in the tyre ring 126. The tyre ring 126 can be held by supportrollers 130.

While FIG. 1 shows four imaging sensors 104 positioned in theenvironment around the kiln 102, the number of imaging sensors 104included in the disclosed systems and/or operated in the disclosedmethods may vary per embodiment. In some aspects, it may be desirable toachieve 360° coverage of the components of the kiln 102 on any externalsurface 106 or in various locations to monitor the gaps 110 as well asthe gap surfaces 108. In some aspects, systems 100 can include twoimaging sensors, which can include one on each side of the tyre assembly126, each aiming at a gap opening 112 of the gaps 110 as they rotatethrough the FOV. However, each kiln 102 can include 2, 3, 4, 5, 6, 7, 8,9, or 10 or more infrared imaging sensors 104 positioned around the kiln102. It may be desirable to position a first set of imaging sensors 104to provide coverage of a first area, and a second set of imaging sensors104 to provide coverage for a second area. Depending on the length orheight of the components being monitored, the number of imaging sensors104 employed in various embodiments can vary substantially.

The imaging sensors 104 can be any infrared sensor. For example, theimaging sensor can be a long wave IR thermal machine vision camera(e.g., FLIR A615), which can include streaming an image frequency of 50Hz (100/200 Hz) with windowing, an uncooled microbolometer, 640×480pixels, 17 micron detector pitch, 8 ms detector time constant, andoperational temperature over −20 to 150° C. The infrared imaging sensorcan produce radiometric images with radiometric data for each pixel. Insome aspects, the infrared imaging sensor can detect temperaturedifferences as small as 50 mK, which provides accuracy even at longerdistances. The infrared imaging sensor can provide 16 bit temperaturelinear output. The imaging sensor can provide the radiometric data as orabout 307,200 pixels in infrared images with embedded temperaturereadings with the radiometric images. The imaging sensors 104 mayinclude a weatherproof housing (e.g., wind and/or rain tight), which maybe configured as spark proof or explosion proof housing. As such, thehousing of the shown image sensors may be configured to be explosionproof as known in the art. The housing can include any of a solidanti-corroding aluminum construction, epoxy polyester powder paint,germanium window, dust proof, water proof, explosion proof, andoptionally with a heater and/or cooler, TEC or fluid cooling system.

The housing can also be a fluid cooled housing (e.g., FIG. 9 ) in orderto regulate the temperature of the IR camera. While an example of anuncooled IR camera has been used, it should be recognized that the IRcamera can include a cooling system that actively cools the camera.

In some aspects, the radiometric data/images from the infrared sensor(e.g., radiometric IR camera) produces at least 16 bits of infrared dataper pixel. These radiometric data/images can be used by the imaginganalysis computer reading or recording the ‘count’ data (e.g., 16 bits)for each pixel, which when converted represents the thermal temperatureof the pixel. This feature of using radiometric data/images providesmore information for the present invention compared to IR images thatare just JPEG images (e.g., non-radiometric data) from IR cameras thatdon't contain any thermal data and instead rely on image comparisons todetect change.

In some embodiments, discussion of images or infrared images isconsidered to be radiometric digital data from an IR camera so that thealgorithms process the radiometric digital data. The use of radiometrycan use temperature measurement data for each pixel, where theradiometric measurements can be used for reading the intensity ofthermal radiation, which can be used for temperature determination foreach pixel. The radiometric thermal data for each pixel with pixelvalues correspond to the temperature of the scene. The radiometric dataprovides a precise temperature, which allows for external sceneparameters to be compensated for emissivity (e.g., a measure of theefficiency of a surface to emit thermal energy relative to a perfectblack body source) and window transmission to more accurately determinetemperature. The user (or imaging analysis computer) may obtaintemperature data from the radiometric data, as well as maximumtemperatures, minimum temperatures, and standard deviations foruser-defined regions (points of interest) for one or more pixels or aplurality of pixels.

Some radiometric IR cameras have the ability to compensate forvariations in camera temperature. This allows operators of the systemsto receive output from the radiometric IR cameras that has beenstabilized and normalized, resulting in temperature-stable images orvideo. As a result, a scene with a given temperature can correspond to acertain digital value in the image or video, independent of the camera'stemperature. In some aspects, it can be important to distinguishtemperature measurements as surface infrared measurements becauseradiometric measurements can measure surface temperatures. Metals, andorganic material (like people), are usually completely opaque, andradiometric measurements can be able to resolve their surfacetemperature. Remote temperature sensing of a surface with IR imagingrelies on the ability to accurately compensate for surfacecharacteristics, atmospheric interference, and the imaging systemitself. The surface characteristics that influence temperaturemeasurement are surface emissivity and reflectivity at the infraredspectral wavelengths, which can be considered in the algorithms and dataprocessing described herein.

In some embodiments, the IR camera can be an FLIR A615 model with a 25degree lens, or A615 FOV calculator. The IR camera can be positionedabout 15 meters away from the surface of the rotating kiln, which can beat any angle relative to a tyre gap, and preferably at least one IRcamera or two IR cameras with an optical axis aligned with the kiln,such as aligned with a tyre gap to view therethrough, such as shown inFIGS. 1A-1B. The A615 model can have 640×480 pixels, a close focus of0.25 m and a hyperfocal distances o 20.55 m. Accordingly, the type of IRcamera can vary. Also, the IR camera can be actively cooled by includingan internal cooling system. Additionally, a cooling housing (FIG. 9 )can be used for the IR camera so that the camera can be cooled. Theactive cooling allows for closer placement of the IR camera to the kiln,which can in turn provide advantages for monitoring temperatures underthe tyre assembly as well as for controlling a cooling system that isadapted to spray water onto the kiln for active cooling of the kiln.

In some aspects, the imaging sensors 104 may be infrared imaging sensorsthat provide radiometric data/images. Infrared imaging sensors maycapture wavelengths of light between at least 700 nanometers to 1millimeter, and indicate the captured wavelengths in digital imageinformation transmitted over the network 116 to the image analysiscomputer 114. Upon receiving the digital image information from theimaging sensors 104, the image analysis computer 114 may analyze theimage information to determine temperature information for each pixel inthe digital image. An operator of the system 100 may establish one ormore warning levels or alert levels for one or more regions of interest(e.g., one or more pixels or combinations of adjacent pixels) within thedigital image information of the digital images. The image analysiscomputer 114 may generate one or more warnings and/or alerts if theestablished alerting levels (e.g., threshold temperatures) are exceeded.This may enable an operator to identify problems with the operation ofthe rotary kiln 102, such as a hotspot in the brick layer, earlier thanpreviously possible, resulting in less damage to the kiln 102 becausethe temperatures can be used to control a kiln cooling system that canbe used to spray water selectively on hotspots. Identifying hotspots forselective cooling can be economically beneficial to the entity operatingthe kiln 102.

FIG. 1 also show a cooling system 140 that includes a water source 142,a water conduit 144, a valve 146, and a nozzle 148. However, it shouldbe recognized that the valve 146 can be at any location on the conduit144, such as closer to the cooling system 140 so that there is a lengthof conduit between the valve 146 (e.g., solenoid) and the nozzle (140a). The cooling system 140 can be operably coupled with the imaginganalysis computer 114 or a specific cooling system controller 150 (e.g.,computing system 600, FIG. 6 ), such as a PLC controller. The watersource 142 can be a feed line or a storage tank that provides the waterto be sprayed by the cooling system 140. The water source 142 isconnected to a water conduit 144 that provides the water to a nozzle 148that sprays the water onto the rotating kiln 102, where the region ofthe rotary kiln 102 being sprayed can be varied. The valve 146 can be acomputer controlled valve, such as with a solenoid, that can rapidlyopen and close for releasing bursts or streams of water. While notshown, various known water system components, such as pumps, filters,coolers, thermocouples, or the like can also be included in the coolingsystem 140 to facilitate spraying water onto the kiln. The valves 146,pumps, or other equipment can be controlled by the cooling systemcontroller 150, and may provide operational analytics to the coolingsystem controller 150. The cooling system controller 150 can receiveinstructions or data from the imaging analysis computer 114, or both canbe the same computer where an imaging module can provide instructions ordata to a cooling module. The temperature data that is obtained by theimaging and hotspot detection processes herein can be used fordetermining where on the kiln and when during a rotation, such aslocations of specific rotational positions, a hotspot can be treatedwith a water spray (e.g., water vapor, steam) from the nozzle 148. Insome aspects, the nozzle 148 can be actuatable so that it can be movedand directed toward identified hotspots for selective cooling sprays, orthe nozzle 148 may have a fixed area of spray such that an array ofnozzles 148 (or array of cooling systems 140 or components thereof)provides full coverage of desired regions that may need to be cooled.Once a hotspot or potential hotspot is detected, the cooling system 140can initiate a cooling protocol that sprays water onto the hotspot as itrotates through the spray region. The valve 146, under computer control,can selectively release pressurized water to spray the hotspot andoptionally surrounding regions. The control of the valve 146 allows thespray to be turned off so that water is not wasted spraying regions ofthe kiln that are not problematic or do not have hotspots. Whilecontinuous spray can be performed, it is less than desirable. As such,the selective spray onto particular regions of the kiln provided by thecooling system 140 can help control and reduce hotspot temperatureswithout wasting water or causing damage to the components of theindustrial plant that may arise from excess water and flooding. Here,the nozzle 148 is shown to be directed toward the tyre assembly 124.However, a plurality of nozzles 148 (each associated with a solenoid orother quick valve control) can be provided and directed to any desiredarea of the kiln 102, where the nozzles 148 can be fixed or movable tochange the aim and trajectory of the water spray.

While not shown, each sprayer can include its own reservoir, or eachsprayer can be connected to a water supply line, or combinationsthereof.

FIG. 1 also shows the imaging analysis computer 114 with a display 118that can provide a user interface for monitoring images from the imagingsensors 104 and data obtained from computations of the digital imageinformation in the images obtained during the monitoring protocols. Thecomputer 114 connects via the network to the imaging sensors 104.

FIG. 1A. shows a cross-sectional side view of a portion of the tyresystem 124, so as to show the gap 110 between the tyre ring 126, tyreblocks 128, and gap surface 108.

FIG. 1B shows a top view of the gap 110 as defined by the tyre blocks128, and gap surface 108, and showing an infrared imaging sensor 104aimed at each gap opening 112, such as along a longitudinal tyre gapaxis or longitudinally aligned with a longitudinal axis of the kiln 102.However, there may be an angle between the optical axis of the imagingsensor 104 and the longitudinal axis of the kiln, such as up to 45degrees, 30 degrees, 20 degrees, 15 degrees, or up to 10 degrees. Thisallows for viewing under the tyre ring 126 for better imaging of a hardto image area. The two infrared imaging sensors may image a largepercentage of the tyre gap surface 108, such 100%, 95%, 90%, 80%, 75%,50%, 40%, 25%, or the like.

FIG. 1C shows a temperature monitoring and control system 160 thatincludes the imaging sensors 104 operably coupled to a cooling system140 via the computer 114. Accordingly, the imaging sensors 104 can beoutfitted with transmitters (e.g., wired, wireless, optical, etc.) totransmit image data to the computer 114; however, the imaging sensors104 may include transceivers to also receive data, such as control data,from the computer 114. Correspondingly, the cooling system 150, such asthe solenoid valves 146, can be outfitted with receivers (e.g., wired,wireless, optical, etc.) to receive cooling data (e.g., valve openingand closing data) from the computer 114; however, the cooling system 150may include transceivers to also transmit data, such as temperature dataor operational data, to the computer 114. The view of FIG. 1C is across-sectional profile of the kiln 102 in order to illustrate placementof the imaging sensor 104 relative to the nozzle 148, which is onopposite sides of the kiln 102. However, the nozzle 148 (along with theother components of a cooling system) can be placed anywhere along thecircumference and/or length of the kiln 102, and any number of nozzles148 may be included.

In some embodiment, the placement of the nozzle(s) 148 can bespecifically located so that the water spray does not produce vaporsbetween the imaging sensors 104 and the surface of the kiln 104 (e.g.,tyre assembly 124) being imaged. While water vapor is formed from thesprayer 140, the vapor is not sprayed in a direction to interfere withthe visuals of the imaging sensors 104 imaging the kiln 102. It has beenfound that placing the nozzle(s) 148 too close to the imaging sensors104 or anywhere the resultant vapor passes between the imaging sensor104 and kiln 102 causes problems with temperature monitoring and coolingsystem operations due to the vapors causing artifacts or errors in theIR image data. Accordingly, an imaging sensor 104 can have a field ofview 105, represented by the viewing cone, that defines the lowerboundary 152 of received water spray from the nozzle 148 so that allgenerated water vapor rises and stays out of the field of view 105.

In some embodiments, the nozzles 148 may be positioned so that they donot spray water on the same side or underneath the imaging sensor 104.As such, the bottom point 154, or nadir, of the kiln 102 can mark theclosest to the imaging sensor 104 that the water reaches so that thevapor does not travel to the side of the imaging sensor 104 and obstructthe field of view 105. That is, the area being sprayed is either above(boundary 152) the imaging sensor 104, on the opposite side of the kiln102 from the imaging sensor, or below but directed to the opposite sideof the kiln 102 so that the bottom point 154 prevents steam from passingthrough the field of view 105.

The selective positioning of the nozzles 148 to avoid vaporcontaminating the IR reading of the imaging sensor 104 can allow forimproved continuous monitoring of the kiln for hotspot detection andmonitoring. Placing the imaging sensor 104 vertically above the watersprayer causes vapor contamination that effects the data and causeserrors in the calculations for determining and monitoring the kilntemperature and hotspots. These errors are now avoided by selectiveplacement of the nozzle 148 to avoid vapor contaminating the IR images.The nozzles 148 can be placed on the down side with respect to rotation,or be placed on the upside so that the kiln rotations upwardly past thesprayer.

FIG. 1D shows a top view of the gap 110 as defined by the tyre blocks128, and gap surface 108, and showing the nozzle 148 of the coolingsystem 140 aimed at each gap opening 112, such as along a longitudinaltyre gap axis or longitudinally aligned with a longitudinal axis of thekiln 102. The nozzle 148 can have a spray direction that can be alignedwith the longitudinal tyre gap axis, or at an angle thereof. However,angles, such as up to 10, 20, 30, or 45 degrees off longitude may beacceptable. This allows for spraying cooling water under the tyre ring126 for better cooling of regions that may be susceptible to overheatingand hotspots due to the thermal problems associated with the tyreassembly 124. In some instances, only one spray nozzle 148 is used for agap 110, by spraying into one opening 112. However, sprayers may spraycooling water over a large percentage of the tyre gap surface 108, such100%, 95%, 90%, 80%, 75%, 50%, 40%, 25%, or the like. This can improvecooling and temperature control of the kiln 102 and inhibit hotspotformation under the tyre assembly 124.

FIG. 11A illustrates a kiln 250 and a preheater 260 for the kiln 250.The kiln 250 can be a rotary kiln that includes a main kiln conduit 252that extends from a kiln burner 254 at the kiln outlet to a kiln inletthat has a calciner burner 256 that heats the preheater 260. Arrows showfuel entering into the kiln burner 254 and calciner burner 256 such thatthe output temperature can be controlled to a desired kiln temperatureand a desired temperature at the base 262 of the preheater 260. The kiln250 is shown to include a tertiary air duct 258 that provides heated airto the base 262 of the preheater 260. The base 262 of the preheater 260is coupled to the kiln 250 and can include the calciner burner 256. Thecalciner burner 256 can provide heat to the preheater 260 that heats thedifferent preheater levels 264 a-e.

The preheater 260 is shown to include a first preheater level 264 a thathas a bottom material conduit feeding into the rotary kiln main kilnconduit 252. The first preheater level 264 a is also coupled to amaterial conduit that has an upper end coupled to the upper end of thefirst preheater level 264 a and a lower end at the base 262. The firstpreheater level 264 a includes a connector conduit that connects the topof the first preheater level 264 a to the top of the second preheaterlevel 264 b. The second preheater level 264 b, third preheater level 264c, fourth preheater level 264 d, and fifth preheater level 264 e aresimilarly arranged as known in the art or preheaters. As such, eachpreheater level 265 a-e includes a vessel, such as a cyclone vessel,that has the illustrated material and gas conduits. However, the fifthpreheater level 264 e includes a material inlet 266 and a gas outlet268. The flow of gas is illustrated by dashed line arrows and the flowof material is illustrated by solid line arrows.

The preheater 260 is also shown to include at least one IR imagingdevice 140 for each preheater level 264 a-e. Each IR imaging device 140is operably coupled with an imaging processing computer 114, which canperform the IR image analysis as described herein to track thetemperature of each preheater level 264 a-e.

Example temperatures are provided for the kiln (e.g., 280° C. of gasoutlet and 100° C. of material outlet), preheater base (e.g., 1000° C.),and preheater levels (e.g., 890° C., 897° C., 665° C., 503° C., and 316°C.). Accordingly, the preheater levels 264 a-e cool the further awayfrom the kiln 250 or calciner burner 256. As such, modulation of thetemperature of the kiln 250 and/or calciner burner 256 can be used tomodulate the temperatures of the preheater 260. As such, when a lowtemperature is detected, the calciner burner 256 can increase thetemperature at the base 262, which then incrementally level by levelincreases the temperature of each preheater. Also, the tertiary air duct258 includes a damper 259 to control the flow rate of heated gas, whichcan also be controlled to provide more or less heat to the base 262 andto the first preheater level 264 a to control the temperature of thepreheater 260 level by level.

In some embodiments, a graphical preheater model can be generated forthe preheater. The graphical preheater model can include a model of eachpreheater level as well as the conduits therebetween. Similar to thedescription regarding the 2D and 3D models of the rotary kiln, a 2Dmodel of the preheater can also be generated that is used to generate a3D model of the preheater. For example, each preheater level vessel andoptionally the conduits can be identified and their dimensions inputinto a calculation to model generator to generate a virtual model. Thedimensions can be suitable for all of the different shapes and sizes ofthe preheater level vessels and conduits. The model generator cangenerate a virtual model of the shape of each component of thepreheater. Additionally, the IR images can be normalized and configuredinto a 2D model of each component or each preheater level vessel. The 2Dimage model can then be wrapped around or otherwise overlaid onto the 3Dmodel of the preheater to provide a virtual 3D model of the temperatureof the preheater and each preheater level thereof. The temperature datacan be overlaid onto the 3D model in real time so that the displaydevice can graphically display the preheater or the individual preheaterlevels. Accordingly, virtual 3D temperature model with the temperaturedata in real time can be displayed to an operator of the rotary kiln.The data may also be saved for later analysis. Any temperaturevariations that are not desirable can be identified in the IR data andthen visually represented on the virtual 3D temperature mode.

In some embodiments, the location of the IR camera is known relative tothe preheater level. Accordingly, a preheater model can include theactual IR cameras therein. As such, FIG. 11A can represent a 3D model(if in 3D) of the preheater with the preheater levels showing real timetemperatures and the locations of the IR cameras. The 3D model can alsobe manipulated on the computer (114) to change the location thereof.This can allow for simulating or providing virtual changes beforeimplementing the changes in the physical world.

In some embodiments, each preheater level can include one or more IRcameras. In some aspects, each preheater level includes only a single IRcamera. The IR camera can record the IR data and provide the IR data tothe image processing device that generates the images, maps, and modelsdescribed herein. The temperature data can provide the temperature for arespective preheater level. The temperature data in the images can bedisplayed, such as shown for FIGS. 2-2A. The methods of FIGS. 3-4C canbe performed to monitor the temperature and temperature variations ofeach preheater level.

In some embodiments, the palette of the preheater model and displayedimages can be varied as needed or desired. The palette can be the sameor different from the palette of the rotary kiln. The adjustability ofthe palette can be helpful to distinguish between certain components,identify certain features, or contrast with the kiln. However, thepalette of the preheater model can be the same as for the kiln model toprovide consistence to the operator and viewer.

In some embodiments, the region of interest can be included in a fieldof view of the IR camera for a particular level. The field of view canbe the entire preheater level, or a portion thereof. This allows forrecording the temperature data for each preheater level, from startup toany desired timepoint or until shutdown. A log or history of thetemperature of each preheater can be included in a preheater leveltemperature profile. Each preheater level can be monitored separatelydue to the significantly different temperatures from the first preheaterlevel to the last preheater level.

In some embodiments, an offset is allowed for the measured temperatures.The system can include an HD IR camera, portable or fixed, to image thedifferent levels of the preheater. The HD IR data can be used to true upthe observed temperature. This can allow for better temperaturemonitoring. As such, an HD IR camera can be used in calibrating the IRdata from the fixed IR cameras to provide better temperaturemeasurements. As described herein, the emissivity of each surface andthe distance therefrom from the fixed IR camera can be used forimproving the temperature measurements.

In some embodiments, the system can monitor the temperature of eachpreheater level in real time. The temperature can be compared toselected prior timepoints or for historical periods. The temperaturevariation in the preheater level can be monitored for changes for acurrent day, compared to the previous day, compared to the same day in aprior week, and any trends can be identified. The temperature data foreach preheater can be monitored in real time and displayed in a 3D modelshowing the temperatures (e.g., similar to FIGS. 2-2A). Also, thetemperature data can be shown as a line graph that tracks thetemperature in real time, such as shown in FIG. 12 . As shown, eachpreheater level includes temperature variations. In some instances, thetemperature variations cause the controller to increase temperatureoutput from the heater to increase the temperature of the preheaterlevels. In some instances, the temperature variation peaks are a hotspot and the temperature decreasing protocol is performed, such asclosing the kiln airduct damper or decreasing the heating in the heaterat the base of the preheater. Also, a spraying protocol can be performedwith each preheater level when the temperature reaches an upperthreshold. The timeline can be as long as needed or desired.

In some embodiments, the system can be configured to receive input for atimeframe for comparison of the current temperature data to priortemperature data. The time comparisons can be entered by form fillablefields or by making selections of predetermined timeframes. Accordingly,a running comparison of a historical temperature to a real timetemperature can be performed as shown by the dashed lines in FIG. 12 .

This temperature data representation can also be used to compare thedifferent preheater levels to each other. As shown, the temperature ofeach preheater level decreases in sequence, in part, due to the heaterbeing by the first preheater level.

The IR cameras can monitor the preheater and kiln temperature to keepthe surface within a temperature range as desired or needed, such aspreventing hotspots. The cooling system can allow for an allowabletemperature range to be set for one or more discrete areas, such as atany preheater level, along the casing shell or under the tyre assembly,where the IR cameras and sprayers can cooperatively operate to providethe temperature control. This allows for automatically cooling thepreheater and/or kiln and specific locations to within a designatedtemperature range, which can prevent or inhibit hotspot formation ofdevelopment. For example, the upper temperature of the kiln can be 330°C. and any temperature thereover can cause activation of the coolingsystem and water spray, which can be activated to reduce thetemperature, such as to a lower threshold of about 260° C. before thecooling system is shut off. However, it should be recognized that thedesired upper and lower temperature thresholds can be changed and set asdesired. Accordingly, water vapor at 100° C. or higher (e.g., 150° C.superheated) is still cooler than the surface of the kiln, and therebystill provides cooling. This allows use of water vapor contacting andcooling the kiln 102.

FIG. 8 provides an example of a cooling system 800 that can be used andcontrolled by the IR system as described herein. The cooling system 800can include a water reservoir 802 that is fluidly coupled to a pump 804or other pressurizing device that provides pressure to the water in thewater reservoir 802 or being supplied therefrom. The pressurized wateris supplied to a supply line 806 that is fluidly coupled to one or moresprayers 808. Each sprayer 808 can include a solenoid valve 810 or otherfast action valve that can quickly open and close for selective waterspray bursts of desired duration and spray pressure. Each sprayer 808can include conduit 811 and a nozzle 812 at the end that can bepivotable or have a fixed trajectory. When pivotable, the nozzle 812 maybe mounted to a motorized swivel or 3-axis motorized gimble or the like.The movable nozzle 812 allows for tracking a hotspot and spraying thecooling water onto the hotspot while it is moving past the nozzle, whichallows for a longer duration of spray onto the hotspot compared to afixed nozzle. The supply line 806 extends past all of the sprayers 808so that the water can be continuously supplied to all of the sprayers808. The number of sprayers 808 and dimensions of the supply line 806can be modulated along with the pressure supplied by the pump 804 tocontrol the amount of pressure received at an end sprayer 808 in orderto satisfy the requirements. To help with maintaining pressure andallowing draining and removal of water, such as heated water (e.g.,overheated or vaporizing water), from the supply line 806, a controlvalve 814 can be provided past the last sprayer 808. The control valve814 can be selectively opened and closed to help build pressure and toallow water drainage. A thermocouple 813 may be associated with the line806 and/or control valve 814 under control of the controller orcomputer, such that when the water in the line 806 reaches a certainthreshold temperature, the control valve 814 opens and the line ispurged and replaced with cooled water. Also, a recycle pump 816 can beincluded in the supply line 806 to pump water therefrom and pump thewater to a water cooling system 818. The water cooling system caninclude a reservoir and active refrigeration components to chill thewater to a desired temperature, such about 4° C., 10° C., 15° C., or 25°C. or any range therebetween or as economically feasible. A chilledwater supply line 820 can provide the water to the water reservoir 802,which can also include a control valve 814 and recycle pump 816.However, the water reservoir 802 and the water cooling system 818 may bethe same device reservoir. The nozzle 812 can be any type of nozzle,such as a flat fan nozzle, cone fan nozzle, jet sprayer, or other.

FIG. 9 shows an imaging sensor 104 that has a cooling housing 902 thathas a cooling fluid inlet 904 and a cooling fluid outlet 906, where acooling fluid conduit 908 (e.g., shown by the dashed arrow) couples thefluid inlet 904 and fluid outlet 906. The cooling housing 902 can befluidly coupled to a cooling system (e.g., FIG. 8 ) to provide coolingfluid for cooling the imaging sensor 104.

FIG. 11B is the same as FIG. 11B with the addition of showing theoptional sprayers 808 positioned relative to each preheater level 264a-e. However, the positioning may be modulated. It should be clear thata water supply is provided to each sprayer 808, such as shown in FIG. 8.

FIGS. 2-2A show a graphical user interface 200 for monitoring images 205obtained from the imaging sensors 104 in order to determine whether ornot a hotspot is present in the field of view. The data processingprotocols can be performed by the imaging analysis computer 114 so thatvisual information in the graphical user interface 200 can be providedon the display 118 for an operator of the system 100. FIG. 2A showstemperature deviations compared to a historical reference for thedefined area of the rotating kiln. However, the same interface can useimages of the preheater, such as different preheater levels.

The images 205 can be parsed into non-kiln areas 202 and kiln areas 204as well as preheater level areas when used. The image 205 can be parsedto show positive control areas 207 with a hotspot (white circle) and/ornegative control areas 209 without any hotspots. Any of these may belabeled as a region of interest 210. The kiln is rotating so that eachimage (e.g., each frame) may have a unique region of interest 210, whereeach tyre gap can be identified and tracked. This allows or hotspots inthe rotating kiln to be tracked as it rotates. This allows the hotspotto be followed as it moves across the FOV. This also allows for theregion of interest 210 to be followed as the region rotates with thekiln rotation.

The images 205 can be parsed into one or more regions of interest 210and identified by boundary indicators, such as a frame or window aroundeach region of interest 210. The sequence of images can show the regionof interest 210 moving along with rotation of the kiln. The regions ofinterest 210 can be determined by the operator and input into theimaging analysis computer 114, or by the imaging analysis computer 114analyzing prior selected regions of interest 210 and determining pixelscommonly present in the regions of interest 210 to be a region ofinterest (e.g., based on historical data from images 205). The largerarrow in the region of interest 210 may be set by an operator to pointto features, such as a specific preheater level or a tyre gap, which maybe selected for enhanced viewing. For example, a single tyre gap can bemarked as the first tyre gap so that the rest of the tyre gaps can belabeled with alphanumeric identifiers for tracking.

In some aspects, the image 205 may be received from a single imagingsensor 104, such as at any one of the imaging sensor 104 locations shownin FIG. 1 . In some aspects, the image 205 may be generated by stitchingtogether two or more images from two or more imaging sensors 104, suchas any two or more of infrared imaging sensors or infrared imagingsensors combined with visible spectrum cameras. The image or videostitching of images from multiple imaging sensors may be performed byany of the methods known in the art. For example, in some aspects,OpenCV may be used to perform video stitching. Some aspects may utilizeVideo Stitch Studio by Video Stitch of Paris, France. Other aspects mayuse other methods.

The graphical user interface 200 can include input controls, cameracontrols, display controls, image controls, region of interest (ROI)controls, threshold controls, and alarm controls in order to allow theoperator to control substantially any aspect of the monitoring protocol.The operator can: select which camera or combinations of cameras arebeing displayed by the input controls, select the field of view with thecamera controls, select how the image from the camera looks on thedisplay with the display controls, select the scaling or other imageadjustments with the image controls, select various ROIs with the ROIcontrols, select temperature thresholds for one or more pixels or groupsof pixels in the images with the threshold controls, and select one ormore alarm levels and alarm display types (e.g., audible and/or visible)with the alarm controls. Over time, the data input into the graphicaluser interface 200 can be monitored and registered with the imaginganalysis computer 114, and the input data can be analyzed to determinean automated operating protocol that is performed automatically by theimaging analysis computer 114 based on historical operations. Theoperator can adjust any operational parameter on the fly to update theautomated operating protocol. Each rotational position can be identifiedso that the rotation can be used so that the entire kiln circumferenceat a tyre can be fully monitored.

In some embodiments, the graphical user interface 200 also includes ascale indicator, a warning threshold control, and an alert thresholdcontrol. The scale indicator determines a graphical resolution ofsurface temperature ranges rendered within a region of interest of theimage 205. For example, a smaller or narrower temperature range mayprovide an image that can communicate more fine detail between surfacetemperatures of the image (e.g., between a region with or without ahotspot).

The graphical user interface 200 can be operated by the warning andalert threshold controls being operated by an operator in order to setindependent thresholds for warning indicators (e.g., possible hotspot)and alert indicators (e.g., critical hotspot detected). The exampleshown in FIG. 2 may provide a warning threshold at a temperaturevariation that indicates a small or lower temperature hotspot in one ofthe regions of interest, and an alert threshold at a large or highertemperature hotspot variation in one of the regions of interest. For thepreheater, the warning and alert thresholds can be tailored to thepreheater operating temperatures at the different preheater levels. Thatis, each level can have its own warning and alert threshold.

The graphical user interface 200 can also include a temperature variancestatus indicator, which can be shown as a probability of a hotspot(e.g., under a kiln surface) in a region of interest. The hotspotpresence status indicator can include a minimum, maximum, and averagetemperature variance (e.g., shown as probability of a hotspot) currentlydetected within selected regions of interest 210, such as a knownlocation susceptible to hotspots (e.g., tyre assembly) and a problemarea with prior hotspots (e.g., positive control). The alert windowshows alerts when the minimum, maximum, or average temperature variance(e.g., shown as probability of hotspot) shown in the status indicatorfor a pixel or area of associated pixels have exceeded either of thewarning or alert thresholds. Different flashing lights (e.g., differentcolor), alarm sounds (e.g., different volume or sound pattern or wordnotifications via speakers), or combinations may be provided toindicates newness or severity of a detected hotspot as well as atemperature variation in a preheater level. The cooling system can beactivated, such as initiating a water spray sequence onto a hotspot,once a hotspot is detected with a temperature outside the allowabletemperature variance. When a preheater level is too cool, the heatingsystem can be increased to increase the temperature.

The graphical user interface 200 can also include a flying spotindicator (arrow in region of interest 210). The flying spot indicatorprovides an indication of a temperature or probability of a hotspot at aposition (or pixel) in the image 205 that a pointing device may behovering over. The preheater and rotating kiln can be monitored in realtime by moving a mouse that moves the arrow, and the pixel(s) underpointed at by the arrow can be monitored for temperatures andpossibility of hotspot.

Each region of interest 210, such as a preheater level, may include itsown separate parameters, such as a scale indicator, warning and alertthresholds, temperature variance status, probability of hotspotindicator, cool region indicator, and others. By selecting each of theregions of interest 210 individually, the display of the graphical userinterface 200 may switch so as to display parameters corresponding tothe selected region of interest. This can allow for monitoring thedifferent preheater levels separately, in groups, or all together. Toedit one or more parameters for a region of interest, the region ofinterest is selected, for example, via a pointing device such as a mouseby clicking on the region of interest 210. The parameters correspondingto that selected region of interest are then displayed, and may beedited directly via the graphical user interface 200. It should berecognized that the region of interest 210 can move across the screen bythe rotation of the kiln being matched with the movement of the regionof interest 210 frame across the image 205.

As discussed above, in some aspects, the image 205 may be generated bystitching together images captured by multiple imaging sensors 104.Graphical user interface 200 can be modified providing for themanagement of images from multiple imaging cameras 104. A graphical userinterface 200 can include a camera selection field, region name fieldand link to region field. The camera selection field allows auser/operator to select between a plurality of imaging sensors, such asimaging sensors 104, that may be under control of, for example, theimage analysis computer 114. When a particular imaging sensor 104 isselected in the camera selection field, the image 205 shown in thegraphical user interface 200 may be received from the selected camera.In a particular embodiment, each region of interest shown in the image205, such as the regions of interest 210, may be imaging sensorspecific. In other words, the system 100, or more specifically the imageanalysis computer 114, may maintain separate parameters for each imagingsensor 104 utilized by the system 100. The separate parameters mayinclude the number, names (see below) and configurations of regions ofinterest for each imaging sensor, warning and alert levels for eachregion of interest, and any linking between regions of interest (e.g.,adjacent preheater levels), both within an image captured by one imagingsensor or across multiple images captured by multiple imaging sensors. Alist of imaging sensors available for selection in the camera selectionfield may be generated based on configuration data providing the list ofimaging sensors and indications of how imaging data may be obtained fromthe listed imaging sensors.

The region name field allows each region of interest 210, such as thosewith common hotspots or known hotspots or specific tyre block orspecific tyre gap or a specific preheater level, to be named by anoperator to allow for easy tracking and monitoring (e.g., firstpreheater level). A specific hotspot can be monitored as it moves acrossthe FOV by monitoring the pixels indicative of the hotspot in each imageor frame, so that the hotpot appears to move across the pixels alongwith the rotation of the kiln when viewing a sequence of the images. Thevalue in the region name field may change as each region of interest 210is selected so as to display a name associated with the selected regionof interest. Thus, region name field may be a read/write field, in thata current value is displayed but can be overwritten by an operator, withthe overwritten value becoming the new current value. Regions that maynot have a hotspot can be named as controls so that the temperaturevariance is determined with known surfaces without hotspots. Each tyregap may be labeled as a unique region of interest, such as in each imageor frame, such that the tyre gaps can be monitored with the rotation ofthe kiln.

The image analysis computer 114 can be provided in variousconfigurations from standard personal computers to cloud computingsystems. FIG. 6 , described in more detail below, provides an example ofan image analysis computer 114, and includes the features of a standardcomputer. The image analysis computer 114 may communicate with theimaging sensors 104. For example, the image analysis computer 114 may beconfigured to transmit one or more configuration parameters to one ormore of the imaging sensors 104, and command the imaging sensors 104 tocapture one or more images. The image analysis computer 114 may furtherbe configured to receive digital images from the imaging sensors 104,capturing different perspectives of a scene or environment.

The image analysis computer 114 may store instructions that configurethe processor to perform one or more of the functions disclosed herein.For example, the memory may store instructions that configure theprocessor to retrieve an image from the imaging sensor(s) 104 anddisplay the image on the electronic display 118. The memory may includefurther instructions that configure the processor to define one or moreregions of interest in one or more images captured by one or moreimaging sensors 104, and monitor temperatures, temperature variances, orpossibility of a hotspot being present in the regions of interestthrough successive images captured from the imaging sensor(s) 104. Insome aspects, the memory may include instructions that configure theprocessor to set warning and/or alert threshold values for temperatureswithin one or more regions of interest defined in the image(s) of thescene or environment or defined or fixed fields of view of each camera,and generate warnings and/or alerts that a hotspot may be present or ispresent when those threshold values are exceeded. The alert may be inthe form of a water spray from the cooling system.

FIG. 3 is a flow chart of a process 300 of one exemplary embodiment ofthe methods for detecting a hotspot on a preheater level and/or rotatingkiln that can be performed by the embodiments of the systems disclosedherein. The process can include obtaining an IR image (step 302) fromthe image data from the imaging sensors 104, which can be stitchedtogether to form an image 205. In some aspects, the image 205 may begenerated based on image data from only a single imaging sensor, or morethan two imaging sensors. The image 205 includes an array of pixels,each pixel having a pixel value. Each image can be of a specificrotational position so that a specific discrete (e.g., specific tyregap) location is present in the image (e.g., at a specific time orspecific rotational position). Each pixel value represents lightcaptured at a position corresponding to the pixel's location within thepixel array. The field of view may be fixed, and thereby each pixel canhave a defined pixel location in the array that corresponds to a surfaceof the field of view at a specific rotational position of the kiln orspecific preheater level. Due to rotation of the kiln, each rotationalposition can have a unique region of the kiln being imaged, where theseries of images can track a specific location of the kiln as it rotateswith the rotation of the kiln. The preheater and the preheater levelsare static, and the cameras can be imaged at any region of a preheaterlevel. The image 205 is then processed to determine pixel temperaturevalues (step 304), which determines temperatures for each pixel based onthe pixel values in the image 205. The process can create a temperaturemap for each image (step 306), such as for each rotational position ofkiln or each preheater level, where each pixel in the temperature maphas a corresponding pixel temperature data. In some aspects, for eachpixel value in the image 205 (e.g., at specific rotational position),there is a corresponding temperature value in the temperature map. Atemperature map can be generated for each IR image, and thereby for eachrotational position of the kiln or each preheater level.

The process can analyze the temperature values included in thetemperature maps across at least two images (e.g., two images of thesame rotational position, such that a specific discrete location of thekiln of specific preheater level is in the same pixel location in thetwo images), and preferably across a plurality of images over time, inorder to identify a historical temperature variance for each pixel (step308) for each rotational position or each preheater level. The imagesthat are analyzed together can be of the same rotational position of thekiln or same preheater level, and thereby of the same tyre gap(s). Thisprovides a range of historical temperatures, a historical temperaturevariance, over time for a specific tyre gap to show how the temperatureof each pixel can vary over time when there is no hotspot for the pixelat the specific rotational position of the kiln.

For example, a first pixel may represent a first surface of the kiln ata specific rotational position or specific preheater level, and thetemperature of that surface can vary due to changing ambienttemperatures, such as throughout the day, or across weeks, months, orseasons. The surface temperature for a specific area (e.g., specifictyre gap or preheater level) is allowed to vary without there being anindication of a hotspot, such as by varying within an allowablevariation in temperatures. The historical variation of pixeltemperatures for each pixel at a specific rotational position orspecific preheater level are aggregated to produce a historicaltemperature variation map (step 310) that includes an allowable range oftemperatures for each pixel at that rotational position or eachpreheater level. The same rotational position is compared acrossdifferent images, and thereby across rotations. Similarly, the samepreheater level is compared across different images.

The temperature variation map may include a value or range of values foreach temperature variation for each pixel in the temperature map. Assuch, the historical variation map (310) shows the historicaltemperature variation over a time period for a specific rotationalposition and thereby a specific tyre gap or specific preheater level.The temperature map, for a current IR image, is then compared to thehistorical variation map, such as by each pixel in the temperature mapbeing compared to the corresponding pixel in the historical variationmap (step 312) for the specific rotational position (e.g., specific tyregap) or specific preheater level. The comparison results in the currenttemperature for a pixel being less than, the same, or greater than avalue in the historical variation map to generate a category map (Step314). When the current temperature for a pixel is greater than a valuein the historical variation map, the pixel is categorized as abnormal(e.g., hotspot or cool region) in the category map. Otherwise, when thecurrent temperature is less than or the same as the values in thehistorical variation map, the pixel is categorized as normal (e.g., nohotspot or cool region). Each value in the category map may indicatewhether a corresponding temperature value in the temperature map iswithin a normal range or is categorized as abnormal with respect to thehistorical variation map, which includes data for each pixel for theallowable variation in temperature for the specific rotational positionor specific preheater level. When categorized as abnormal, the processcan determine whether there is a hotspot region by linking adjacentpixels that are categorized as abnormal (step 316). After the categorymap is generated one or more abnormal regions are determined to behotspot regions by processing the data. Based on the abnormal regionsbeing hotspot regions, the process 300 can generate one or more alerts(step 318). While process 300 is serialized in the preceding discussion,one of skill in the art would understand that at least portions ofprocess 300 may be performed in parallel in some operative embodiments.The same principles can apply to cool regions that may occur in apreheater level.

FIG. 4 is a flowchart of a process 400 of one exemplary embodiment of amethod for determining temperature values for pixels in an infraredimage that can be performed by the embodiments of the systems disclosedherein. In block 402, a pixel value for an image from an infrared sensoris obtained. In some aspects, the image may be captured from one of theimaging sensors 104, discussed above with respect to FIG. 1 . In someaspects, one or more of the imaging sensors 104 may record wavelengthsof light between 700 nanometers and 1 mm (infrared wavelengths) alongwith intensity, brightness, or other light parameter, and represent thecaptured light as a digital image with each pixel having pixel data(e.g., pixel value). The pixel value received in block 402 may be onepixel value from an array of pixel values included in the capturedimage, where each pixel can include its own pixel value. This can bedone for an image for each rotational position of the rotary kiln orspecific preheater level.

In block 404, a depth value corresponding to the pixel value is obtainedfor the pixel (or each pixel) in the corresponding image. In someaspects, the depth value may be obtained from a depth map of the image.The depth map may be obtained, in some aspects, via a ranging device,such as a radio detection and ranging (RADAR) or light and radar orLIDAR device. In some aspects, the depth map may be obtained usingstructured light. The depth map may be obtained by known methods, andmay be used due to the fixed field of view, where each pixel can bemapped with the distance to the surface in the fixed field of view thatcorresponds with the pixel. It should be recognized that the depth valuefor some pixels will be different from other pixels of the same imagedue to the imaging sensor being at an angle relative to the surface ofthe kiln or preheater component. In an example, the distance of eachpixel to each region being imaged can be used for all of the pixels fornormalizing the size of each pixel, which can then allow for the pixelsto generate a rectangular 2D image.

In block 406, an emissivity value corresponding to the pixel value isobtained. As such, each rotational position can be considered for theemissivity of the image for that specific rotational position. In someaspects, the emissivity value may be based on a setting of the imagingsensor referenced in block 402. For example, in some aspects, theimaging sensor may be configured to capture objects of a givenemissivity for each pixel. That is, a surface that corresponds to apixel can have an emissivity value, and thereby tracking the rotationalposition of the kiln can be important. This emissivity value may be usedin block 406. In some aspects, an object database may include theemissivity of known objects or regions of the kiln for specificrotational positions or for the specific preheater levels. In someaspects, an emissivity value of an object or region being searched forin the image may be used. For example, in some aspects that may beimaging a specific tyre gap, an emissivity of the kiln surface at thetyre gap may be used for the pixels that correspond therewith. The tyreblocks may have a different emissivity. This allows for the image toinclude a plurality of surfaces, and each pixel can correspond to aspecific surface with the specific emissivity of that surface. As such,emissivity for various objects (e.g., from surface of the kiln and tyreassembly or different preheater levels) can be obtained, where theobjects can be concrete, gravel, metals, plastics, rubber, or otherindustrial surfaces. This emissivity value may be configured by anoperator in some aspects.

In block 408, a temperature value corresponding to the pixel value isdetermined based on the corresponding depth value and emissivity value.In some aspects, block 408 may include translation of a raw value fromthe imaging sensor into a power value. For example, in some aspects, theimaging sensor may provide imaging values in digital numbers (DNs). Insome aspects, the power value may be determined using Equation 1:

$\begin{matrix}{\mspace{76mu}{{{{{Power} = {\left( {{{Raw}\mspace{14mu}{Signal}\mspace{14mu}{Value}} - {{Camera}\mspace{14mu}{Offset}}} \right)\text{/}{Camera}\mspace{14mu}{Gain}}}\mspace{76mu}{A\mspace{14mu}{signal}\mspace{14mu}{value}\mspace{14mu}{may}\mspace{14mu}{be}\mspace{14mu}{determined}\mspace{14mu}{by}\mspace{14mu}{Equation}\mspace{14mu} 2\mspace{14mu}{below}\text{:}}\mspace{76mu}{{{Signal} = {{K_{1} \times {power}} - K_{2}}},\mspace{76mu}{{wherein}\text{:}}}\mspace{76mu} K_{1}} = \frac{1}{\tau_{Atm} \times {Emissivity} \times {ExtOptTransm}}},{K_{2} = {\frac{1 - {Emissivity}}{{Emissivity} \times {AtmObjSig}} + \frac{1 - \tau_{Atm}}{{Emissivity} \times \tau_{Atm} \times {AtmObjSig}} + \frac{1 - {ExtOptTransm}}{{Emissivity} \times \tau_{Atm} \times {ExtOptTransm} \times {ExtOptTempObjSig}}}}}} & (1)\end{matrix}$

τ_(ATM) is the transmission coefficient of the atmosphere between thescene and the camera, and is a function of spectral response parameters,object distance, relative humidity, etc.

ExtOptTransm is the External Optics Transmission and is the transmissionof any optics (e.g. a protective window) between the object being imagedand the optics of the imaging sensor. The external optics transmissionis a scalar value between zero and one. External optics that do notdampen the measurement have a value of one, and optics that completelysampan the measurement have a value of zero.

ExtOptTempOjbSig is the temperature of any optics (e.g., a protectivewindow) between the object being imaged and the optics of the camera.

Emissivity is the emissivity of the object whose temperature is beingdetermined.

To convert the signal calculated via Equation 2 into a temperature, someimplementations may use Equation 3:

$\begin{matrix}{{Temperature} = \frac{B}{\log\left( {\frac{R}{Signal} + F} \right)}} & (3)\end{matrix}$

where B, R, and F may be calibration parameters retrieved from theimaging sensor. The temperature may be in Celsius or Kelvin.

Also, a model for the total radiation W_(tot) incident on the imagingsensor can be determined by the following Equation 4 by:W _(tot)=ε_(obj)τ_(atm)τ_(extopt) W _(obj)+(1−ε_(obj))τ_(atm)τ_(extopt)W _(amb)+(1−τ_(atm))τ_(extopt) W _(atm)+(1−τ_(extopt))W _(extopt)  (4)

In this equation, the ε_(obj) is the emissivity of the object beingimaged; τ_(atm) and τ_(extopt) are the transmittance of the atmosphereand external optics, respectively; and W_(obj), W_(amb), W_(atm), andW_(extopt) are the radiation from the object, ambient sources,atmosphere, and external optics, respectively. The emissivity ε_(obj) ofthe object is known or assumed prior to imaging the object. Thetransmittance τ_(atm) of the atmosphere is a function of the measuredrelative humidity ϕ and temperature T_(atm) of the atmosphere, and themeasured distance d_(obj) from the sensor to the object. Thetransmittance τ_(extopt) of the external optics is typically estimatedduring a calibration procedure that occurs prior to imaging the object.

Given the temperature T_(obj) of the object, and the measuredtemperature T_(amb) of the ambient sources, temperature T_(atm) of theatmosphere, and temperature T_(extopt) of the external optics; theradiation W_(obj) from the object, radiation W_(amb) from the ambientsources, radiation W_(atm) from the atmosphere, and radiation W_(extopt)from the external optics, respectively, are calculated using Planck'slaw, which describes the radiation W emitted at wavelength λ by a blackbody at temperature T and is given by Equation 5.

$\begin{matrix}{W = {\frac{2\pi\;{hc}^{2}}{\lambda^{5}}\frac{1}{{\exp\left( \frac{hc}{\lambda\; k_{B}T} \right)} - 1}}} & (5)\end{matrix}$

In Equation 5, h is the Planck constant, c is the speed of light in themedium (a constant), and k_(B) is the Boltzmann constant.

Additionally, the IR camera maps the total radiation W_(tot) to imageintensities (i.e., pixel values) I=ƒ(W_(tot)) under the radiometricresponse function ƒ of the camera, which is typically estimated during acalibration procedure that occurs prior to imaging the object.

The above model of the image formation process may be used to solve forthe temperature T_(obj) of the object, given all of the other variables,as follows. Given an image I of intensities acquired by the camera, thetotal radiation W_(tot)=ƒ⁻¹ (I) (i.e., image intensity maps to incidentradiation under the inverse of the camera response function). Then,solving equation 1 for the radiation W_(obj) from the object yieldsEquation (6).

$\begin{matrix}{W_{obj} = \frac{\begin{matrix}{W_{tot} - \left\lbrack {{\left( {1 - ɛ_{obj}} \right)\tau_{atm}\tau_{extopt}W_{amb}} +} \right.} \\\left. {{\left( {1 - \tau_{atm}} \right)\tau_{extopt}W_{atm}} + {\left( {1 - \tau_{extopt}} \right)W_{extopt}}} \right\rbrack\end{matrix}}{ɛ_{obj}\tau_{atm}\tau_{extopt}}} & (6)\end{matrix}$

Then, Equation 6 is solved for the temperature T_(obj) of the object asEquation 7.

$\begin{matrix}{T_{obj} = {\frac{hc}{\lambda\; k_{B}}\frac{1}{\log\left( {\frac{2\pi\;{hc}^{2}}{\lambda^{5}W_{obj}} + 1} \right)}}} & (7)\end{matrix}$

In block 410, the determined temperature value is stored in atemperature map, such as in step 306. The temperature map may be used asinput for one or more of the processes discussed herein. A temperaturemap may be a data structure that stores temperature values for at leasta portion of pixels in an image or region of interest. In some aspects,the temperature map may be stored in the memory of the image analysiscomputer 114. Each pixel can have a temperature range in the temperaturemap, wherein the temperature range is based on temperatures for thespecific pixel over the historical time period.

Decision block 415 determines whether there are additional pixels toprocess in the image (or region of interest). If there are additionalpixels, processing returns to block 402. Otherwise, processing continuesin order to determine whether or not a hotspot is present in any of theimages.

FIG. 4A includes a flow chart of a process 470 of generating ahistorical variation map for the variation in temperatures for eachpixel. The process 470 can include obtaining a plurality of historicalpixel temperatures for a first pixel (step 472), which can be done foran image for each rotational position or each preheater level. Theplurality of historical pixel temperatures for a first pixel are groupedin a distribution of historical pixel temperatures for the first pixel(step 474). A threshold difference (D) is determined based on thedistribution of historical pixel temperatures (step 474), wherein thethreshold difference D is the maximum allowed difference from thedistribution of historical pixel temperatures that the pixel can havebased on the historical temperature data for that pixel. The thresholddifference D is then combined with the distribution of historical pixeltemperatures to determine the threshold temperature (TT) (step 476). Thethreshold temperature TT is then combined with the distribution ofhistorical pixel temperatures to determine an allowable difference intemperature, which allowable difference in temperature is set as thehistorical variance in temperature (step 478). The historical variationmap can then be prepared to include the allowable difference intemperature or the historical variance for each pixel (step 480). Theprocess can analyze the temperature values included in the temperaturemaps across at least two images (e.g., of the same rotational position),and preferably across a plurality of images over time, in order toidentify a historical temperature variance for each pixel (step 308).This provides a range of historical temperatures, a historicaltemperature variance, over time to show how the temperature of eachpixel can vary over time when there is no hotspot or elevatedtemperature for the pixel. For example, a first pixel may represent afirst surface, and the temperature of that surface can vary due tochanging ambient temperatures, such as throughout the day, or acrossweeks, months, or seasons. The surface temperature is allowed to varywithin a defined variance without there being an indication of ahotspot, such as by varying within an allowable variation intemperatures. The historical variation of pixel temperatures for eachpixel are aggregated to produce a historical temperature variation map(step 310) that includes an allowable range of temperatures for eachpixel. The temperature variation map may include a value or range ofvalues for each temperature variation for each pixel in the temperaturemap. As such, the historical variation map shows the historicaltemperature variation over a time period. This can be done for eachrotational position, such that the specific surfaces in the field ofview for the rotational position are tracked and mapped together. Also,this can be done for each preheater level.

FIG. 4B includes a flow chart of a process 420 of generating a categorymap for the current temperatures for each pixel based on the historicalvariation of each pixel. The historical variation map may indicateacceptable ranges of pixels that are within a normal range (e.g., nohotspot) and unacceptable ranges of pixels that are outside the normalrange (e.g., hotspot is present). The pixels outside the normal rangecan be analyzed to determine whether or not they include a hotspot inthe kiln.

In the illustrated embodiment, process 420 utilizes two differentapproaches to determine whether a pixel is within a “normal” temperaturerange. A first approach compares a temperature value to a statisticaldistribution of pixel temperatures based on historical values for thesame pixel to determine a temperature variance (e.g., historicalvariation map), such as the same pixel of the same surface in a specificrotational position of the kiln across a series of images of that samesurface in the specific rotational position. This also applies to seriesof images of each preheater level. In most embodiments, a first pixel orfirst group of pixels is compared to the same first pixel or group ofpixels to determine if the current temperature is within the historicaltemperature variation (e.g., no hotspot) or outside the historicaltemperature variation (e.g., hotspot is present). In some instances,this protocol can also include comparing a first pixel (or first groupof pixels) to a second pixel (or second group of pixels) by comparingthe pixel values (temperatures) as well as comparing the pixelvariations (temperature variance) between two regions. Pixels withlarger variances compared to the historical variation map over time canindicate the presence of a hotspot. To the extent the temperature valueis within a specified distance (e.g., threshold difference “D”) from adistribution of temperature variances, the pixel may be consideredwithin a “normal” range. However, in a scenario that includes surfacetemperatures changing gradually over time, such as from throughout theday, process 420 may not detect a pixel that indicates a highertemperature rating using this first technique, as the highertemperatures may gradually become a new “normal”, as the highertemperatures may change the nature of the distribution over time (e.g.,over a day, week, month, season, year, etc.), possibly due to a slowlydeveloping hotspot. To avoid this possibility, process 420 may comparethe temperature value or temperature variation for a first pixel acrossmultiple images of the same rotational position to a threshold value(e.g., hotspot threshold value) that defines a maximum value of normal,regardless of historical values. By combining a comparison to historicalvalues and to a threshold value, process 420 provides a robustcharacterization of a current temperature variation value as either“normal” or “abnormal.” The process also works for detecting coolregions on a preheater level.

The temperature (i.e., “counts”) difference from the referencebackground has to be large enough that it triggers as a variation. Thisis where the sensitivity factor is considered in the algorithm, wherethe higher the sensitivity, the lower the difference (e.g., difference“D”) between the current pixel temperature value and the referencebackground pixel temperature value is required in order to be consideredas a potential hotspot pixel (e.g., abnormal). As such, thedetermination of a hotspot pixel based on the difference in temperaturefor a pixel compared to the allowable distribution of pixel temperaturevalues is not a simple fixed-threshold relationship, but is based onwhether the difference D falls outside the expected variance observed onthat pixel over time. However, some embodiments use the fixed-thresholdto determine normal pixels from abnormal pixels.

In block 422, a temperature value (e.g., temperature variance value) forat least one pixel is received from an imaging sensor or from thetemperature map. In some aspects, the imaging sensor may captureinfrared wavelengths of light and convert the captured light intodigital data which forms an array of temperature values, with a pixeltemperature value for each pixel. The pixel temperature value receivedin block 422 may be one temperature value (temperature variation) of onepixel in the array of temperature values (temperature variation) of aplurality of pixels.

Block 424 determines whether the pixel temperature value (e.g.,temperature value variation) is within a specified distance (e.g.,threshold difference “D”) from a statistical distribution of pixeltemperature values or temperature value variations for each pixel. Thestatistical distribution may be based on historical values of eachpixel. In some aspects, the specified distance from the distribution isa Mahalanobis distance. For example, in some aspects, if the squaredMahalanobis distance is greater than the inverse chi squared cumulativedistribution function at a specified probability (e.g. 0.99), then it iswithin the distribution. Otherwise, it is outside of the distribution insome aspects.

In some aspects, block 424 may make different determinations. Forexample, in some aspects, block 424 may determine whether thetemperature value (e.g., temperature variation for pixel) is within adistance representing 90%, 95%, or 99% of the statistical distribution.If the received value is not within the specified distance from thedistribution, process 420 moves to block 426, which marks the pixel asabnormal in a pixel map (e.g., category map).

If the temperature value is within the specified distance, process 420moves from decision block 424 to decision block 428, which determineswhether the pixel temperature value is above a threshold value (e.g., aset threshold temperature value), which may or may not be the same asthe temperature of the threshold difference D. This determines whetherthe temperature variation is greater than a threshold temperaturevariation for each pixel. The threshold value referenced in block 428may be based on operator configured information, as a set value, ordetermined over time based on historical information. The configuredinformation may be specific to an image (generated by a single imagingsensor or generated by stitching together data from multiple imagingsensors), or a region of interest within an image. If the temperaturevalue is above the threshold value, process 420 moves to block 426,which marks the pixel temperature value as abnormal (e.g., in categorymap) as discussed above.

Otherwise, if the temperature value is within the distance D from thedistribution for the pixel in step 424 or is not greater than thethreshold value in step 428, process 420 moves to block 430, whichrecords the temperature value as normal in the category map.

Due to the historical nature of the data that defines the distributionand thresholds for temperature, the distribution can be updated with thenew data, such as when the new data is marked as normal. Thedistribution is not updated when the pixel temperature value isidentified as being abnormal. Also, the distribution can be anydistribution (e.g., normal Gaussian) and the measurement to thedifference D may be an average, mean, center, edge, or other definedpart of the distribution.

After the distribution is updated in block 432, process 420 moves todecision block 434, which determines if there are more pixels in animage to process. If there are, process 420 returns to block 422 andprocessing continues. If there are no more pixels, processing maycontinue for determining whether there is a hotspot on/under a surfacein the images.

FIG. 4C includes a flow chart of a process 450 of generating an alert(e.g., or initiating a cooling procedure) based on an abnormal region ofpixels that are identified as being a region of a hotspot or a coolregion in a preheater (e.g., specific preheater level). In block 452,the temperature category map is received indicating normal and abnormaltemperature values for each pixel within the image. For example, in someaspects, a category map may represent a matrix or two dimensional arrayof true/false or 1/0 values, with a true/1 value in a position of thecategory map indicating a pixel located at a corresponding position ofthe image is abnormal, while a false/0 value in a position of thecategory map indicates a temperature or temperature variance located ata corresponding pixel position of the image is normal. In some aspects,the meaning of these values may be reversed. In some aspects, thecategory map received in block 452 may be generated by process 420,discussed above with respect to FIG. 4B.

In block 454, a region of interest with one or more abnormal pixelswithin the image is determined. The region of interest may be determinedin some aspects, by selecting one or more pixels of a previouslyidentified regions of interest. A region of interest can be any regionin the environment that is more susceptible to having a hotspot fromdegradation of internal brick of the kiln or any preheater level. Theregion of interest may also be selected in real time based on an area ofabnormal pixels that are adjacent to each other. In some aspects, theregion of interest may encompass a subset of all the pixels in an image.In some aspects, the region of interest may be defined by an operator,for example, by operating a pointing device such as a mouse or touchscreen, as well as interacting with the graphical user interface 200 toidentify a portion of the infrared image 205. A region of abnormalpixels may be identified by connecting a region of contiguous or nearcontiguous abnormal pixels. This can be done for images of a specificrotational position, such as when the images are of the same subjectmatter (e.g., same tyre gaps in same pixel locations) in the field ofview for the specific rotational position.

Decision block 456 determines whether a hotspot was determined to bepresent in the region of interest, where the hotspot can be a region ofabnormal pixels or region of interest in block 454. If no hotspot in theregion of interest was identified, then process 450 continuesprocessing. If a hotspot region was identified in block 456, thenprocess 450 can make different decisions. One decision is that if thereis any hotspot detected in the images, then the process moves to block458 and an alert is generated or a cooling protocol initiation isgenerated. However, the system can be configured to compare any detectedhotspot (e.g., pixel having hotspot) to historical values for thepixel(s) or to threshold values before generating an alert or generatingthe cooling protocol initiation. This can be done for each rotationalposition of the kiln so that hotspots can be tracked, which allows thesame hotspot to be tracked and monitored as the rotary kiln rotates. Assuch, a specific rotational position can be compared to itself so thatthe identified regions of interest (e.g., tyre gap) thereof are in thesame pixel locations. Specific preheater levels can also be tracked toensure operation within a certain range.

In one option, when a hotspot is determined to be present in the pixelsof a region of interest (e.g., when the region of interest is partiallyor entirely a hotspot), the size of the area of the region of interest(e.g., size of the area of pixels identified to be a hotspot) isdetermined and compared to a threshold area size as shown block 460.When the size of the area of the hotspot is greater than a thresholdarea size, then the process 450 generates the alert/cooling 458. Whenthe size of the area of the hotspot is less than a threshold area size,then the alert/cooling is not generated and monitoring for hotspots ormonitoring the size of the region of a hotspot or suspected hotspotcontinues. Cool regions may also be similarly identified in a preheaterlevel.

In another option, when a hotspot is determined to be present in thepixels of a region of interest (e.g., when the region of interest ispartially or entirely a hotspot), the size of the area of the region ofinterest (e.g., size of the area of pixels identified to be a hotspot)is determined and compared to a historical area size as shown block 462.The historical area size can include an average of historical area sizesfor a particular hotspot region or averaging across particular hotspotregions. For example, the hotspot region may be small with a low rate ofincreasing area size, the protocol determines whether the currenthotspot region is above the historical area sizes or a size that is toodifferent (e.g., difference, or change in size) from the historical areasize. When the size of the area of the hotspot is greater than thishistorical area size or a value to much higher than the historical area,then the process 450 generates the alert/cooling 458. When the size ofthe area of the hotspot is within the historical area size range orclose to the historical area size (e.g., within a distance/value fromthe average or range), then the alert is not generated and monitoringfor hotspots or monitoring the size of the region of hotspot continues.However, it should be noted that certain limitations or definitions canbe in place so that a hotspot or potential hotspot reaches a thresholdto generate a cooling command, such that the cooling protocol isinitiated to cool the surface of the kiln in order to cool theunderlying hotspot. Accordingly, the temperature and/or hotspot size mayreach a threshold where the system generates the cooling command and thecooling system initiates the water sprays into the hotspot.

Also, a size of the identified hotspot region can be compared to apredetermined percent of a region of interest. In some aspects, thepercent of the region of interest may be 1%, 2%, 3%, 4%, 5%, 6%, 7%, 8%,9%, 10%, 15%, 20%, 25%, 30%, 33%, 35%, 50%, 75%, or 100% of the regionof interest. If the area of the hotspot region is larger than thepredetermined percent, process 450 moves to block 458 where analert/cooling is generated. Accordingly, tracking hotspots and regionsof interest as the kiln rotates can be beneficial, where the specificrotational position is tracked and compared to the historical values.

Some aspects of block 458 may utilize different conditions forgenerating an alert or generating a cooling protocol instruction thanthose described. For example, in some aspects, an absolute size of thehotspot region (number of adjacent pixels) may be used to determine ifan alert/cooling should be generated, either to the exclusion of or inconjunction with the size of the hotspot region relative to a size ofthe region of interest.

In some embodiments, the process may calculate an aggregated “normal”temperature (e.g., temperature variation across images) for pixelswithin the abnormal region (e.g., hotspot region) and an aggregatedtemperature variation within the region of interest. If a distancebetween the aggregated normal temperature variance and aggregatedmeasured temperature variance is above a threshold, an alert may begenerated in some aspects. For example, some aspects may includeselecting a nominal or normal temperature variation from thedistributions for each of the pixels in the abnormal region. Thesenominal values may then be aggregated. Similarly, the measuredtemperatures and temperature variations within the abnormal region maybe separately aggregated. This aggregate of measured temperatures ortemperature variations represents an aggregated variance for theabnormal region. If the measured variance is substantially (representedby the threshold) above a normal variance for the abnormal region, analert may be generated. This technique considers a situation where noneof the pixels within the abnormal region may be above a warning or alertthreshold, and thus, no alert is generated based on these thresholds.Additionally, the abnormal hotspot region may be a relatively smallportion of the region of interest, such that no alert is generated.However, given the number of pixels (within the abnormal hotspot region)that are above their nominal or normal points, (i.e. the variance of theabnormal hotspot region), there may be cause for concern such that analert/cooling is proper.

In some aspects, generating an alert may include displaying a message onan electronic display, such as a system control console. In some otheraspects, generating an alert may include sending an email, text message,or writing data to a log file, or any combination of these. Similarly,the generation of the cooling command may be made by notifying anoperator of the system in the same ways, so that the operator canmanually start the cooling protocol, or the cooling protocol can beautomatically initiated with or without the notifications (alert) to theoperator. In some instances, when a preheater level is too cool, thenthe alert can be provided and optionally a heating protocol can beinitiated to increase the temperature of the preheater level.

In some embodiments, a system for detecting a hotspot can include: atleast one infrared imaging sensor; and an imaging analysis computeroperably coupled with the at least one infrared imaging sensor. Theimaging analysis computer can be configured to control any infraredimaging sensor and acquire infrared images therefrom at any rate and inany duration. The imaging analysis computer can be configured to analyzethe infrared images in order to detect a hotspot on the rotating kiln bytracking specific surfaces or objects of a specific rotational positionof the kiln. The imaging analysis computer can be configured to detecthotspots surface where hotspots should not be (or is not present in abaseline) in order to determine that there is a problem in the kiln,such as faults in the brick layer, in the vicinity of hotspots.

In some embodiments, the system can be configured to obtain at least onebaseline infrared image of a fixed field of view without a hotspot beingpresent. The baseline image can be updated over time prior to a hotspotbeing detected on a surface in the fixed field of view. The baselineimage can be an image from an imaging sensor, or a historical compositeof pixel data from a plurality of baseline images over time, such as forthe same FOV for the same rotational position of the kiln. This allowsfor comparisons between images with no hotspots and images that havehotspots. In some instances, the at least one baseline image is thehistorical variation map, or the one or more images used to prepare thehistorical variation map. The at least one baseline infrared image canbe a single image when representing the baseline for each pixel withoutthe hotspot. However, the at least one baseline image can be a pluralityof images, or a composite prepared from a plurality of images so as tohave the distribution thereof (e.g., historical variation map). The atleast one baseline infrared image can provide the threshold differenceand threshold temperature as well as the allowable pixel variations,which can be of a specific rotational position.

In some embodiments, the system can perform methods to analyze allpixels in the fixed field of view for changes from the at least onebaseline infrared image to at least one subsequent infrared image. Thechanges can be in the pixel data for each pixel, such as changes in thewavelength of the infrared light that indicates changes in temperatureof surfaces emitting the infrared light, and thereby changes in hotspotsor development of hotspots.

In some embodiments, the system can perform methods to identify variabledifferences in temperatures for each pixel in the field of view betweenthe at least one baseline infrared image and the at least one subsequentinfrared image. The variable difference can be determined by assessingchanges in a specific pixel (e.g., pixel location in the pixel array ofthe imaging device) from a baseline image to a subsequent image, such asfor a specific rotational position.

In some embodiments, the system can perform methods to identify one ormore first pixels in the at least one subsequent infrared image having afirst variable difference in temperature that is greater than anallowable variable difference in temperature for the one or more firstpixels in the at least one subsequent infrared image compared to anallowable variable difference in temperature for the one or more firstpixels in the at least one baseline infrared image. This can be done fora specific rotational position, and all rotational positions can besimilarly monitored. Also, this can be done for each preheater level.This protocol can be performed as described in connection to FIG. 4B.Here, the one or more first pixels are identified because they havepixel temperature values that are identified as being abnormal becausethey are outside the allowable variable difference by being greater thanthe threshold difference by being above the threshold temperature. Theidentified pixels that are abnormal can be appropriately marked in thecategory map, such as for the specific rotational position (e.g., havingthe same region of the kiln in the FOV) or specific preheater level.

In some embodiments, the system can perform methods to determine the oneor more first pixels as being a hotspot based on the first variabledifference in temperature of the one or more first pixels being greaterthan the allowable variable difference in temperature of the one or morefirst pixels in the fixed field of view of a specific rotationalposition or specific preheater level. The pixels that are determined tobe a hotspot can be analyzed in accordance with the protocol of FIG. 4C.In some embodiments, the system can perform methods to generate analert/cooling that identifies a hotspot being present in the fixed fieldof view. The generation of the alert/cooling and protocol thereof canalso be performed in accordance with the protocol of FIG. 4C.Additionally, an alert/heating protocol can be performed for a preheaterlevel in accordance with the protocol of FIG. 4C.

In some embodiments, the system can perform methods to identify one ormore first pixels in the at least one subsequent infrared image having afirst variable difference in temperature that is different than (e.g.,greater or lesser) than a second variable difference in temperature forone or more second pixels in the at least one subsequent infrared imagecompared to the at least one baseline infrared image. The region of thefirst pixels can be analyzed to determine the temperature in thebaseline image and the subsequent image, and then determine the changein temperature. Then, the region of the second pixels can be analyzed todetermine the temperature in the baseline image and the subsequentimage, and then determine the change in temperature. The change intemperature for the first pixels is compared to the change intemperature for the second pixels. When one group of pixels changes morethan the other, then it can be determined that the surfaces of thosepixels changed.

In some embodiments, the system can perform methods to determine the oneor more first pixels as being a hotspot and the one or more secondpixels as being devoid of a hotspot. This determination can be madebased on the first variable difference in temperature of the one or morefirst pixels and the second variable difference in temperature of theone or more second pixels in the fixed field of view. When the change inthe first pixels is larger than the change in the second pixels, thereis an indication that there is a hotspot on/under the surface in thefirst pixels. Regions where the temperature variance is similar from thebaseline infrared images to the subsequent images indicate that therehasn't been a change to the surfaces, and they do not have a hotspot.

In some embodiments, the system can perform methods to generate an alertthat identifies the presence of a temperature variance in the fixedfield of view. In some aspects, the imaging analysis computer isconfigured to provide the alert. In some aspects, the imaging analysiscomputer is configured to provide the alert by actuating an audibleand/or visible indicator. In some aspects, the imaging analysis computeris configured to provide the alert by transmitting the alert to a remotedevice. In some aspects, the alert is an audible or visiblecommunication. In some aspects, the alert can trigger activation of thecooling system or heating system. In some aspects, generation ofinstruction to initiate the cooling protocol or heating protocol canfunction as an alert, such as when there is active spraying by thecooling system alerting an operator that there is a hotspot or potentialhotspot. Nevertheless, the operator can be alerted when actively coolingthe kiln surface. Accordingly, descriptions of the alert herein may bealso descriptions of initiating a cooling protocol with the coolingsystem. When the temperature variance is a preheater being too cool, theoperator can be alerted when a heating protocol is initiated to increasethe temperature of a preheater level.

In some embodiments, the imaging analysis computer is configured tomonitor the fixed field of view to detect a hotspot on a kiln, such asat or around the tyre assembly. The surface can be selected fromconcrete, metal, composite, ceramic, plastic, rubber, or combinationthereof of materials of a rotary kiln, such as at the tyre assembly. Forexample, the system can acquire emissivity, reflectivity, or othersurface characteristics that impact absorption, reflection, emission orother optical light property for surfaces in the fixed field of view.The system can acquire emissivity, reflectivity, or other surfacecharacteristics that impact absorption, reflection, emission or otheroptical light property for surfaces having a hotspot. Then, computationscan be performed to determine whether there is a hotspot on/under asurface of the kiln in the fixed field of view of the baseline and/orsubsequent images. Similarly, particular preheater levels may also bemonitored for current temperature and temperature variations.

FIG. 5A illustrates a method 500 of detecting formation of a hotspot.The method may be performed with a system described herein having atleast one infrared imaging sensor and an imaging analysis computer. Step502 includes obtaining at least one baseline infrared image of a fixedfield of view without a hotspot being present at field of view at aspecific rotational position. For example, a specific tyre gap orcombination of specific tyre gaps in the field of view. Step 504includes analyzing some or all pixels in the fixed field of view forchanges from the at least one baseline infrared image (e.g., map) to atleast one subsequent infrared image. Step 506 can include identifyingvariable differences in temperatures for each pixel in the field of viewbetween the at least one baseline infrared image and the at least onesubsequent infrared image. Step 508 can include identifying a one ormore first pixels in the at least one subsequent infrared image having afirst variable difference in temperature that is greater than allowablebased on the distribution of temperature variances in the at least onesubsequent infrared image compared to the at least one baseline infraredimage (e.g., greater than the threshold difference from the distributionor greater than the threshold temperature). Step 510 can includedetermining the one or more first pixels as being a hotspot, andoptionally determining one or more second pixels as being devoid of ahotspot based on the variable difference in temperature of each pixel inthe fixed field of view. Step 512 can include generating an alert (orcooling protocol) that identifies the presence of a hotspot in the fixedfield of view. This can be done for each specific rotational positionand the fixed field of view of each rotational position. This can alsobe done for each preheater level.

In some embodiments, the method can be performed to include providingthe alert from the imaging analysis computer (step 514). This caninclude any of the following: providing the alert by actuating anaudible and/or visible indicator; providing the alert by transmittingthe alert to a remote device; and/or providing the alert as an audibleor visible communication. The alert may be supplemented or replaced withthe instructions by the computer for initiating a cooling procedure fora hotspot.

In some embodiments, the methods can include recording historicalinformation of a plurality of infrared images of the fixed field of viewreceived from the at least one infrared imaging sensor. Such historicalinformation can include the images or image data for a number of imagesover a time period. The historical information can be used forestablishing baselines and controls without a hotspot or othertemperature variance so that the changes in the images when a hotspot ortemperature variance is present can be detected.

In some embodiments, the methods can include providing the alert on adisplay device. Such a display device can show images selected from: aninfrared image from the at least one infrared sensor; a schematic oflocations of the at least one infrared sensor; or a location of analert.

In some embodiments, the methods can include recalibrating the system,which can be scheduled or as needed or desired. Once the system isrecalibrated, the methods can obtain an updated at least one baselineinfrared image after the recalibration.

In some embodiments, the methods are performed such that the fixed fieldof view includes a hard surface. However, weather or the cooling systemthat sprays water can impact whether or not the hard surfaces have wateror any wetness. As such, the method can include: determining that thereis water on the surface of the preheater or kiln in the fixed field ofview; and monitoring the fixed field of view to detect a hotspot ortemperature variation under the water, such as when water is on asurface of the kiln or preheater level. Accordingly, the database mayinclude data for emissivity or other water parameters when on a surface,such as a known surface type of the kiln or preheater.

FIG. 5B shows another method 530 for detecting a hotspot on the kiln.The method 530 can include: associating adjacent first pixels toidentify a hotspot region (step 532); determining a size of the hotspotregion (step 534); and generating a hotspot region size and/ortemperature report that identifies the size and optionally thetemperature of the hotspot region based on the associated adjacent firstpixels (step 536). The method 530 may also include associating adjacentfirst pixels to identify a hotspot region; determining an area of thehotspot region; comparing the area of the hotspot region with athreshold area size; and generating the alert and/or cooling instructiononce the hotspot region has an area that is at least the size of thethreshold size, wherein the threshold area size is a defined value or apercentage of a region of interest. This can also be done for apreheater level.

FIG. 5C shows a protocol 540 for detecting a hotspot. The protocol caninclude identifying a surface region in the fixed field of view that isa surface, wherein the surface region has a surface temperature (Step542). Step 544 can include identifying a hotspot region in the fixedfield of view that is a hotspot by having a variable difference intemperature for each pixel that is greater than the allowable variabledifference in temperature for the surface region from the at least onebaseline infrared image to the at least one subsequent infrared image.The protocol 540 can also determine the surface region in the fixedfield of view in the at least one baseline infrared image as beingdevoid of a hotspot, wherein the surface region has a pixel temperaturevalue that is within the allowable variable difference in temperaturefor each pixel (step 546). The protocol 540 can also determine thehotspot region in the fixed field of view in the at least one subsequentinfrared image as having a hotspot, wherein the hotspot region havingthe first variable difference in temperature that is greater than theallowable variable difference in temperature for each pixel (step 548).This can also be done for a preheater level.

The methods recited herein describe the use of images and maps, such asin FIGS. 3, 4-4C, and 5A-5C. These images that are acquired by the oneor more imaging sensors can be used in creating a 2D model of thepreheater and the rotary kiln. The 2D model can be used for the imagesor maps in the methods described herein. For example, a 2D model can begenerated from the images to provide a 2D rectangle that approximatesthe cylinder of the kiln opened flat or a body of a preheater level.

FIG. 10A shows a representative 2D model 170 of a rotary kiln based onthe parameters of the rotary kiln, such as those input into the systemincluding diameter, length, brick thickness, incline angle, or otherparameter. The 2D model 170 is shown to include the rotary kiln 172,tyres 174, and pads 176. The dimensions of the rotary kiln, tyres 174,and pads 176 can be input into the system. The infrared images can thenbe overlaid or otherwise combined with the 2D model 170, which cancorrelate specific landmarks or features of the images to specificlocations on the 2D model 170. The 2D model 170 can then be used in themethods of the invention with the image data overlaid. The 2D model 170can be wrapped around a cylinder having the parameters of the rotarykiln to generate a 3D model of the rotary kiln.

A 3D model of the rotary kiln can be build from 3D bodies of theconstituent parts. FIG. 10B shows the components of the 3D model 180 andFIG. 10C shows the 3D model 180. The 3D model 180 is shown to includethe cylindrical body 182, tubular brick layer 184, bricks 186, tyre 188,pads 190, and support rollers 192. The separate components allow for the3D model 180 to be selective in the components shown, which can be usedin the analysis. For example, the cylindrical body 182 can be the onlycomponent of the 3D model 180 used in an analysis of the temperatureprofile. In another example, the full 3D model 180 can be used foranalysis of the temperature profile, and selective components can beremoved. For example, the tyres 188 can be removed to analyzetemperatures thereunder. Similarly, the pads 190 can be removed from the3D model 180 to analyze temperatures of the surface of the kiln underthe pads 190.

Additionally, the bricks 186 can be modeled so that the individualbricks can be estimated and modeled in the 3D model 180. This allows forthe methods to monitor individual bricks 186 and monitor for brickfallout from the brick layer 184.

The 2D model 170 can be wrapped around the cylinder 182 to form the 3Dmodel. Alternatively, the 3D model can be matched to infrared images toprovide the details thereof. The mapping of the 3D model to image dataallows for the 3D model to be rotated in virtual space for monitoringthe rotating kiln. The real time data can then be matched to the 3Dmodel for the analyses descried herein. This allows for a monitoring ofthe rotary kiln in real time by using the 3D model 180 and mapping theinfrared image data to the rotating 3D model 180.

The 3D model 180 can be populated with identification points, such asthose described herein. The 3D model 180 can be used to track therotation of the rotary kiln, and thereby the images from imaging sensorscan be used to generate the 2D model (e.g., image stitching), and thento generate the 3D model. The subsequent images can be compared toeither the source images or to the 3D model. In an example, thesubsequent images are compared to the source images for the monitoringpurposes

The 3D model 180 may also be associated with models of the imagingsensors 104 and the sprayers 140. This can allow for tailoring a systemby virtually moving the imaging sensors 140 and sprayers 140 to obtaindesired or optimal performance. The imaging sensors 104 can be moved invirtual space around the 3D model 180 to determine an optimal placementfor performing the methods described herein. Additionally, the sprayers140 can be moved in virtual space around the 3D model 180 and optionallyrelative to the imaging sensors 104 so that an optimal placement forperforming the cooling methods as described herein. For example, FIGS.1-1D can represent a virtual system with the 3D model showing the rotarykiln with overlaid temperature data from the images, where the imagingsensors and sprayers may be positioned and arranged as needed ordesired.

In an example, the infrared cameras are positioned at different anglesand different locations relative to a preheater and kiln in a realenvironment. A 2D model can be generated, which can include thetemperature data from real images of the real preheater and kiln in avirtual environment. The 2D model can be updated in real time withtemperature data from the images. The angle of each camera and distanceof each sensor pixel to the surface of the preheater or rotary kiln canbe known and used to normalize the temperature data for each pixel. Forexample, FIG. 1B shows an orientation of infrared cameras where somepixels will be for surface areas that are closer and some pixels will befor surface areas that are farther, when there is any angle of thecamera to the surface. The relative distances can be used to normalizethe temperature data to fit on a flat surface, such as the 2D model.This normalizes the data of a pixel for a region further and for aregion closer, so that the data is normalized on a 2D model. Forexample, a camera at an angle can have some pixels on one side imaging aregion that is closer and pixels on the other side imaging a region thatis further. The relative distance between a pixel and its imaged regioncan be known and used to normalize the pixel data for distance. Thisallows generation of a flat normal image, such as a rectangular 2Dimage. For example, the pixels that are closer to the imaged surfaceappear to be smaller than pixels that are farther from the imagedsurface, where the closer pixels have less region than the furtherpixels that have more region in the images. The relative distances canbe used to normalize the pixel data so that all pixels are provided fora normalized size.

The 2D model can be used to provide the x axis and y axis data forcoordinates of features on the images and maps. The 2D model can bewrapped around a cylinder, cone, taper, or other shape or combinationsof shapes to form the 3D model in virtual space. This allows for the xaxis, y axis, and z axis data for coordinates of the 3D map.

In an example, the dimensions of a preheater and kiln are used to get avirtual 3D model thereof. The pixel data can then be applied to thevirtual 3D model to provide a real time 3D model of the temperatures ofthe preheater and kiln. The 3D model of the kiln can be used to trackhotspots as the virtual 3D model of the kiln rotates, which can beprovided on a display device. The 3D model of the preheater can be usedto monitor temperatures on the different preheater levels in real timeto provide a graphical illustration of the operating conditions. Duringthe processes described herein, the 2D data (e.g., data cubes of theinfrared pixel data) can be used for the analysis and all comparisonsand calculations, such as shown in the methods of the figures, andidentification of hotspots. The 3D model can be used for showing thehuman operator the locations of the features of the preheater and kiln,temperatures at each location, and possible hotspots or othertemperature variances. As such, the 3D model allows for visualization ofthe data processing and temperature information that is performed withthe 2D data.

FIG. 7 shows a protocol 700 for treating a hotspot with a cooling waterspray. The protocol 700 can include obtaining data (e.g., hotspot data)for at least one hotspot (step 702). The hotspot data for each hotspotcan include: a location of the hotspot in the preheater or kiln; atemperature of the hotspot; a temperature of the preheater or kilnsurface over the hotspot; an area size of the hotspot; an area size ofthe preheater or kiln surface over the hotspot; a temperature gradientof the hotspot; a surface temperature gradient of the preheater or kilnsurface over the hotspot; a change in temperature from a baselinetemperature for the hotspot; or a change in temperature from a baselinetemperature for the preheater or kiln surface over the hotspot. In someinstances, the hotspot data includes current data compared to historicaldata. In some instances, the historical data includes at least one of:data prior to formation of a hotspot; data from at least one priorrotation of the kiln; data from the current hour; data from the currentday; data from the current week; or data from the current month. Thesystem can be configured such that there is a preset analysis functionto show changes of the temperature of discrete locations or points ofinterest, such as the preheater levels, and the temperature over timecan be tracked for changes over time, such as through the current day,compared to the previous day, trend for the week, compared to same day aprevious week and any time period.

Based on the hotspot data, the sprayer control can identify at least onehotspot to cool with a cooling water spray (step 704). Once a hotspot isidentified to cool, the sprayer controller determines a sprayingprotocol (step 706) to cool the identified hotspot, and then the sprayercontroller controls operation of the cooling system in implement thespraying protocol (step 708). After implementing the cooling protocolfor at least one cycle, cooled temperature data (e.g., data after beingcooled at least one time, which can be IR image data that is processedas described herein for temperatures) is obtained for the cooled hotspot(step 710). The cooled temperature data is then processed to obtain thecooled temperature of the hotspot, and the cooled temperature of thehotspot is analyzed to determine whether or not the cooled temperatureis greater than the acceptable temperature range (step 712). When thecooled temperature is within the acceptable range, the sprayercontroller can terminate the spraying protocol (step 714). When thecooled temperature is greater than the acceptable range, the sprayercontroller can continue the spraying protocol (step 716).

In some embodiments, the sprayer controller is configured to: identify alocation and hotspot data of a specific hotspot on the preheater orkiln; and determine a spraying protocol for the specific hotspot basedat least one of: a water spray pressure; a distance of a specific watersprayer to the location of the specific hotspot on the preheater or kilnsurface; time between actuating solenoid valve of the specific watersprayer and the water being sprayed from the nozzle; time betweenactuating solenoid valve of the specific water sprayer and contactingresultant water spray on the location of the specific hotspot; durationof the location of the specific hotspot being within a spray region onthe preheater or kiln surface; duration of opening the solenoid valve;rotational velocity of the rotating kiln; temperature of sprayed water;temperature or state (e.g., vapor) of sprayed water as it contacts thelocation of the specific hotspot; hottest temperature of the specifichotspot; temperature profile of the specific hotspot; temperaturegradient and area of the hotspot; when to initiate spray by actuatingthe solenoid valve; when to terminate spray by de-actuating the solenoidvalve; position of nozzle of sprayer relative to the location of thespecific hotspot; area of hotspot; or area of water spray on thepreheater or kiln surface.

FIG. 7A shows a cooling protocol 720 for a specific hotspot. The sprayercontroller can: determine timing of initiation of actuation of solenoidvalve relative to the location of the hotspot during rotation of thekiln (step 722); determining time period the solenoid valve is opened tospray the cooling water (step 724); and determining timing ofde-actuation of solenoid valve relative to the location of the hotspotduring rotation of the kiln, such that the water spray ceases as thehotspot moves out of range of the sprayer (step 726). These steps can bedetermined based on the data of the hotspot and on data for operation ofthe sprayer system. This allows the system to modulate how the sprayingis implemented based on data of the hotspot and on data for how thesprayer system operates. For example, the temperature and pressure ofthe cooling water can determine the timing of the spray relative towhere the hotspot is in the rotation so that the hotspot is within aspray region on the surface of the kiln as the hotspot rotates past thesprayer.

In some embodiments, the methods can include: accessing a memory devicethat includes thermal data for one or more surfaces in the fixed fieldof view; obtaining the thermal data for the one or more surfaces in thefixed field of view; and computing with the thermal data for the one ormore surfaces in the fixed field of view during the analysis of thepixels in the fixed field of view.

In some embodiments, the methods can include: accessing a memory devicethat includes distance data for one or more surfaces in the fixed fieldof view from the at least one infrared imaging sensor: obtaining thedistance data for the one or more surfaces in the fixed field of view;and computing with the distance data for the one or more surfaces in thefixed field of view during the analysis of the pixels in the fixed fieldof view.

In some embodiments, the methods can include determining a relativehumidity; and computing with the relative humidity as data during theanalysis of the pixels in the fixed field of view.

In some embodiments, the imaging analysis computer is configured to:associate adjacent first pixels to identify a temperature variation(e.g., hotspot) region; determine a size of the temperature variationregion; and generate a temperature variation region size report thatidentifies the size of the temperature variation region based on theassociated adjacent first pixels. In some aspects, the imaging analysiscomputer is configured to: associate adjacent first pixels to identify atemperature variation region; determine an area of the temperaturevariation region; compare the area of the temperature variation regionwith a threshold area size; and generate the alert once the temperaturevariation region has an area that is at least the size of the thresholdsize, wherein the threshold area size is a defined value or a percentageof a region of interest. This protocol can be performed as describedherein.

In some embodiments, the memory device includes thermal data for one ormore surfaces in the fixed field of view, wherein the imaging analysiscomputer is configured to: obtain the thermal data for the one or moresurfaces in the fixed field of view; and compute with the thermal datafor the one or more surfaces in the fixed field of view during theanalysis of the pixels in the fixed field of view. In some aspects, thememory device includes distance data for one or more surfaces in thefixed field of view from the at least one infrared imaging sensor,wherein the imaging analysis computer is configured to: obtain thedistance data for the one or more surfaces in the fixed field of view;and compute with the distance data for the one or more surfaces in thefixed field of view during the analysis of the pixels in the fixed fieldof view. In some aspects, the imaging analysis computer is configuredto: determine a relative humidity; and compute with the relativehumidity during the analysis of the pixels in the fixed field of view.This protocol can be performed as described herein. This, as well as allof the methods, can be done for a specific rotational position, such aseach rotational position or for a specific preheater level. This allowsfor the entire circumference of the rotary kiln, such as the entire tyreassembly, to be monitored. Also, this allows for each level of thepreheater to be individually monitored.

In some embodiments, the imaging analysis computer is configured toobtain the at least one baseline infrared image by: acquiring a seriesof infrared images of the fixed field of view for a specific area of thepreheater at a specific preheater level or kiln at a specific rotationalposition; analyzing pixel data of each infrared image of the series todetermine a pixel temperature for each pixel for each infrared image ofthe specific rotational position or preheater level; determining a rangeof pixel temperatures for each pixel without a temperature variationbeing present in the fixed field of view across the series of infraredimages of the fixed field of view of the specific rotational position orspecific preheater level; and setting the allowable variable differencein temperature to include the determined range of pixel temperatures foreach pixel without a temperature variation at the specific rotationalposition or specific preheater level. In some aspects, the imaginganalysis computer is configured to obtain the at least one baselineinfrared image of at least one specific rotational position or specificpreheater level by: performing a statistical analysis of the range ofpixel temperatures for each pixel without a temperature variation beingpresent across the series of infrared images of the fixed field of viewof the specific rotational position or specific preheater level todetermine an allowable distribution of pixel temperatures for each pixelat that specific rotational position or specific preheater level; andsetting the at least one baseline infrared image so that each pixelincludes the allowable distribution of pixel temperatures for thespecific rotational position or specific preheater level. This protocolcan be performed as described herein.

In some embodiments, the at least one baseline infrared image is a modelof each pixel with the allowable distribution of pixel temperatures foreach pixel for a specific rotational position or preheater level,wherein the model of pixels is obtained by: determining a distributionof the pixel temperatures for each pixel without a temperature variationbeing present across the series of infrared images of the specificrotational position or preheater level; identifying a maximum pixeltemperature that is greater than the distribution of pixel temperaturesby a first difference at the specific rotational position or preheaterlevel; and setting the first difference from the distribution toindicate absence of a temperature variation for each pixel in the fieldof view of the specific rotational position or preheater level. Thisprotocol can be performed as described herein. Each pixel of eachspecific rotational position or specific preheater level, and thereby ofa specific location on the kiln or preheater, can have its own modelbased on the historical temperature values.

In some embodiments, the imaging analysis computer is configured to:compare each pixel temperature in the one or more subsequent infraredimages with the model of each pixel with the allowable distribution ofpixel temperatures for each rotational position or preheater level;determine a difference between each pixel temperature in the one or moresubsequent infrared images and the model of each pixel for the specificrotational position or preheater level; determine whether the differenceis greater than a threshold difference, when the difference is greaterthan the threshold difference, determine that the pixel is a temperaturevariation (e.g., hotspot) pixel, or when the difference is less than thethreshold difference, determine that the pixel is not a temperaturevariation pixel. In some aspects, the imaging analysis computer isconfigured to: continuously update the model in real time; andcontinuously compare new infrared images with the model in real time.

In some embodiments, the imaging analysis computer is configured to:determine a standard deviation of the distribution of the pixeltemperatures for each pixel of the rotational position or preheaterlevel without a temperature variation (e.g., hotspot) being presentacross the series of infrared images of the specific rotational positionor preheater level; and set the threshold difference as being a defineddifference from the standard deviation.

In some embodiments, the methods can be operated by software. Thesoftware manages the network connections on a 1 to 1 basis with each IRcamera to monitor camera performance, assigns correct algorithms to eachcamera depending on the solution assigned to the camera, monitors alertsfrom cameras, displays an alert and related IR images for all cameras,assigns CPUs to cameras depending on performance requirements andrecords historical information as determined by the preheater and rotarykiln subsystems. The hardware to run the preheater and kiln infraredmanagement system can include a multi-CPU racked based system that isscalable to allow for additional cameras added to each solution. Thehardware, memory and disk management system can be scoped and selectedbased on the final numbers of IR cameras.

The system can contain a series of LCD display screens to show overallmanagement of the infrared system, highlight alert locations as they aretriggered, allow for the display of the IR image from any IR camera, anddisplay operational views of each system such as the cooling systemmanagement, thermal component operations, and hotspot detection. Thedisplay system can utilize the graphical displays from the relativepreheater or kiln region to show locations of IR cameras, IR images andIR alerts locations relative to the preheater or kiln.

In some embodiments, the system can be programmed with instructions toperform the methods described herein. The system can also be programmedto track all hotspot or possible temperature variation (e.g., hotspot)locations as the kiln rotates or monitor each preheater leveltemperature during operation. Accordingly, once an area or location istagged as a temperature variation area, the system can update thedatabase so that this area is monitored as part of a specificallymonitored group as the kiln rotates or the preheater operates. The knowntemperature variation locations can be routinely monitored and analyzedfor temperature variation data, such as source of hotspot, hotspot areagrowth rate, hotspot temperature growth rate, or other information. Thesensitivity of known temperature variation pixels may be programmed sothat system responds to changes in the temperature appropriately, suchas when there are small temperature variation settings the systemmaintains monitoring. There can be a higher threshold until the hotspotis cooled so that an increase in the temperature rate or otherincreasing of the temperature can be identified. Another example issetting a lower threshold in an area without any hotspot history.Accordingly, the system can be programmed to accommodate desiredoperability. Additionally, the known hotspot locations can be tagged forcooling, and also for maintenance and maintenance planning. The systemcan provide real time updates on the status of a known temperaturevariation location, whether or not actively increasing in size ortemperature. When the temperature variation region is increasing in sizeor temperature, the system can provide reports for any increases intemperature change rate or any other temperature or size change over aperiod of time. These reports can include analytical data for theanalyzed temperature variation to provide any of the temperaturevariation parameters described herein in real time or over defined timeperiods.

In some embodiments, the cooling system can be programmed toautomatically change flow rate of cooling water within water conduits,at the sprayer or at other water containing. For example, cooling wateris often carried in pipes, through pumps, and across junctions, and tothe sprayer nozzles. Once a hotspot is identified, the system canautomatically regulate the water spray volume per spray burst or waterspray rate in a continuous spray. For example, the system may generatean alert of for a hotspot, analyze for the location of the hotspot, andthen modulate the water sprayer component to regulate the water spray,such as by shutting off flow of the water with a solenoid. For anotherexample, the system can automatically acute pumps, valves, or otherequipment to modulate, reduce or increase the flow of water in thecooling system or modulate the amount of water sprayed as well as thespray duration, such as per rotation of the kiln. In another example,the computer can enable a water sprayer valve to allow for more waterspray for hotspots that exceed a certain size, temperature increase rateor duration of the hotspot, which may be set by the operator toautomatically control the valves.

The monitoring system can detect markings, unique components, anomalies,or other identifiable or fingerprinting of the rotary kiln. This allowstracking of the rotation of the rotary kiln so that specific regions,such as specific gaps, can be tracked. The tracking can track a specificfeature as it passes through a field of view of the IR camera. The imageto image analysis can then track objects as they move across a series ofimages, by detecting the pixels that provide the temperature value ofthe object changing from one image to the next so that when viewed inseries (e.g., video) the object can be tracked. The different featuresacross and around the kiln can be monitored for references, such as toprovide a temperature fingerprint in a temperature map or historicalvariation map. The temperature fingerprint can be used for monitoringspecific regions or desired areas as the kiln rotate, and allows forsequential images of a specific rotational position to be obtained sothat specific pixels are associated with specific objects. As such, eachrotational position can have a unique temperature fingerprint that canbe tracked and monitored so that temperature variation changes can beobserved.

In some embodiments, the temperature profiles of an image can becompared to a standard temperature profile so that pixels, such asadjacent pixels or regions of pixels, that have temperatures abovedefined limits can be flagged as regions of interest.

In some embodiments, the system can include a number of IR cameras sothat the entirety of the outside of the rotary kiln is monitored byimaging the length of the kiln and recording images of the rotation sothat the entire outer surface area is imaged. In some aspects, thesystem can include at least one IR camera viewing underneath a tyre ringby viewing into a tyre gap, and preferably one IR camera per tyre gapopening (e.g., two IR cameras for each tyre gap).

In some embodiments, the system can include one or more IR cameras foreach preheater level. However, each preheater level can be outfittedwith two or more cameras to monitor the entire surface are of eachpreheater level.

In some embodiments, the system can trigger solenoid valves of thesprayer to control the spray rate in order to avoid excess water anddrippage from the preheater or kiln. Preferably, the sprayed water canbe entirely vaporized before contacting the preheater or kiln surface;however, less than 100% vaporization is allowable. The spray is alsometered to inhibit to quick temperature changes, which is performed bymetering the spray by using data of the temperature as it rotated pastthe IR camera without water vaporization contaminating the IR image andtemperature analysis. The spray can be controlled so that the surface ofthe preheater or kiln does not warp, where the surface curvature, andthereby warping can be monitored with the IR fingerprint and modeling ofthe preheater or kiln surface. The spray can be controlled so thatregions that are within an allowable temperature range are not sprayed.For example, the sprays can be limited to hotspots across the preheateror kiln surface, as well as under the tyre assembly.

In some embodiments, the system can also be configured to perform acooling system calibration in order to determine water spray parametersto achieve a liquid drop spray onto the surface so that the surfacevaporizes the water. In some embodiments, the system can also beconfigured to perform a cooling system calibration in order to determinewater spray parameters to achieve a vapor spray so that vapor isreceived onto the surface. In some aspects, the system inhibits thewater from vaporizing within the system until sprayed from the nozzle.Alternatively, the water may convert to vapor in the conduit or at thenozzle so that the water vapor is sprayed. Optionally, an IR camera canbe used in the calibration so that the water vaporization can be imaged,which allows the system to vary the pressure and solenoid valve controlto optimize vaporization of the water so that liquid water does notcontact the surface of the preheater or kiln. The spray pulse can becalculated to provide a defined amount of water to a specific hotspottemperature profile, or to a specific temperature range. Thecalculations can be used to determine operation of the solenoid valve toachieve liquid or vaporized water contacting the surface of the kiln.Also, the calibration can be performed for the timing of operation ofthe solenoid valve so that the water spray hits a specific area of thekiln surface, such as on a specific hotspot. The fingerprint of hotspotsor other temperature variation regions can be used to generate a patternfor the sequence of solenoid valve opening and closing, which cycles asthe kiln rotates or preheater operates.

In some embodiments, the system models the kiln and sprayers in relationto the IR cameras. This can allow for the IR cameras to monitor hotspotsand rotation thereof so that they are tracked, which allows for thesystem to trigger the water spray in order to spray the specifichotspot(s). In some aspects, the IR camera is about 180 degrees from thesprayer, or at least 90 degrees based on a center axis of the kiln. Insome aspects, the IR cameras and sprayers are positioned relative toeach other such that no water vaporization passes through the IR camerafield of view.

In some embodiments, thickness of the refinery brick layer is monitoredand modeled with the system based on the IR temperature data. Studiescan be done to map brick thickness to operational temperatures, whichallows recorded temperatures to be correlated with brick thickness. TheIR temperature versus brick thickness data can be obtained and saved ina database. For example, a lookup table can include defined brickthickness per pixel temperature. The system can track changes inthickness based on the pixel temperature values. Changes in thicknessthat are faster than a defined rate, or specific thickness thresholdscan trigger the system to activate the water sprayer to cool the surfaceover that region of refractory brick. The water spraying can slow therate of thinning and inhibit degradation of the brick layer and inhibitbrick dropout (e.g., dropping from the brick layer into the kiln). Thespraying may also inhibit the brick from further thinning. As a result,hotspots can be predicted and treated with cooling water to preventtheir formation.

Different thickness thresholds can trigger alerts and sprayingprotocols. For example, the alert and spraying protocol can be generatedat 75%, 50%, 25%, 20%, 10%, and/or 5%, of original thickness. Differentlevels of alert and different levels of spraying can be provided as thethickness is reduced past the thresholds.

Also, the result can be a spraying protocol that maintains the surfaceof the preheater or between a temperature range, such as less than 325°C., and the spraying protocol can be terminated when the surface regionreaches 280° C. However, it should be recognized that the thresholdtemperatures can change. In some aspects, the protocol can be gradualtemperature reduction where different temperature range bands are cooledto a lower level, and then cooled to a lower level. For example, theprotocol can preferentially target hotspots with higher temperatures(e.g., 450° C. or above), and reduce them to about 420° C., and thentarget hotspots with temperatures between 420° C. and 400° C. Thisprotocol can be repeated until the kiln, or specific regions thereof(e.g., region under tyre assembly) is at the desired temperatureprofile. In some embodiments, the operator of the kiln can set the uppertemperature threshold that turns on the cooling sprayers and the lowertemperature threshold that turns off the sprayers.

In some embodiments, a thermal application on the controller sends plcinstructions to PLC server, which manages solenoid valves to controltiming and duration of the spray of each nozzle in order to cover hotspot as the kiln rotates (3.5 RPM). The application can be programmed toreduce PLC spray signals as hotspot temperature decreases. The slowreduction of temperature can inhibit problems that may arise if the kilncools too rapidly, such as inhibiting cooling related weakening of therefractory lining. In some instances, the cooling can be controlled toprovide a moderate cooing rate, such as about 0.25-1° C. per minutes.

In some embodiments, the IR camera can provide high resolution so that asingle refractory brick can be tracked. The bricks are about 24 cmthick, 24 cm tall, and 6 cm wide. As such, the change in temperature canbe sufficient to be noticeable when a single brick drops out. Theindividual bricks or groups of bricks can be monitored each rotation totrack changes in thickness or track bricks that have fallen out so thatthere are holes in the refractory wall. Areas losing bricks can beidentified, and alerts can be provided as appropriate.

The kiln can be monitored every rotation (e.g., monitoring the virtual3D model) so that a single brick dropout can be identified in a singlerotation. In part, a brick dropout causes a significant increase intemperature, and such as change in a single rotation can be identified.Accordingly, the system can keep a real time log of the temperatures inthe virtual 3D model, and an increase in a certain percent or amount orto a certain temperature can trigger an analysis for brick dropout. Thesystem can compare the one or more pixels for a specific rotationalposition with a size of a brick, and when the size matches provides acorrelation, there can be an indication that there has been a brickdropout of the brick lining.

In some embodiments, the temperature of specific discrete regions can becontrolled so that the thickness of the refractory wall stays the sameor increases. This temperature control can reduce the temperature sothat the dust or clink inside of the kiln can adhere to the refractorybrick, which can serve as a patch for holes in the brick were thehotspots may be located. In some instances, the temperature can becontrolled to control the amount of clink that adheres to the refractorywall. In some instances, this can be done to slow down wall erosion.

In some embodiments, the distance data can be used to model and monitorthe outside surfaces of the preheater (e.g., each level) or kiln in 3D.In some embodiments, the brick thickness to temperature correlation canbe used to model and monitor the internal regions of the kiln in 3D.

In some instance, the temperature data and estimated temperaturegradient across the preheater level or kiln from the outer surface tothe inner surface can be plotted and provided on a display for visualmonitoring. For example, a graph that plots the circumferentialdimension against the revolutions and against the temperature can beprepared. The temperature can be provided as a color and/or axis in athree dimensional plot. For example, the outside temperature of apreheater level surface can be determined and compared to the insidetemperature of that preheater level. The system can then correlatepreheater level surface temperatures with the preheater level internaltemperatures, which can be done over a range of temperatures. Thisprovides a data correlation matrix so that when a surface temperature ofthe preheater is measured, the internal temperature is computed. Thesurface temperature and determined internal temperature can be providedon the display to the user, such as in the 3D model. This allows fortracking the external temperature as well as the internal operatingtemperature of each preheater level. The 3D model can be selectivelysliced to provide an illustration of the temperature profile from theouter surface to the middle or across to the other side.

For this and other processes and methods disclosed herein, theoperations performed in the processes and methods may be implemented indiffering order. Furthermore, the outlined operations are only providedas examples, and some operations may be optional, combined into feweroperations, eliminated, supplemented with further operations, orexpanded into additional operations, without detracting from the essenceof the disclosed embodiments.

Preheater

In some embodiments, a system for measuring temperatures of a preheaterof a rotary kiln can include: at least one infrared imaging sensor foreach level of the preheater, wherein the preheater includes at least twopreheater levels; and an imaging analysis computer operably coupled withthe at least one infrared imaging sensor of each level of the preheater.In some aspects, the imaging analysis computer is configured to performthe following for each preheater level: obtain a 3D model of a preheaterlevel of the preheater; obtain at least one infrared image of a fixedfield of view of the preheater level of the preheater; analyze allpixels in the fixed field of view of the at least one infrared image foreach pixel temperature; generate a 2D temperature model of the preheaterlevel; overlaying the 2D temperature model over the 3D model to generatea virtual 3D preheater level temperature model; and providing a visualrepresentation of the virtual 3D preheater level temperature model. Insome aspects, the imaging analysis computer is configured to: obtaindimensions of the preheater level of the preheater; and size the 3Dmodel of the preheater level of the preheater with the dimensions. Insome aspects, the imaging analysis computer is configured to generatethe visual representation of the virtual 3D preheater level temperaturemodel to include the at least one infrared imaging sensor at a locationof the preheater level. In some aspects, the fixed field of viewincludes at least a portion of a preheater level vessel.

In some embodiments, the imaging analysis computer is configured to:provide the a visual representation of the virtual 3D preheater leveltemperature model in a first color palette; and modify the first colorpalette to a second color palette. In some aspects, the imaging analysiscomputer is configured to generate one of the first or second colorpalette to be a same color palette of a virtual 3D rotary kilntemperature model.

In some embodiments, the imaging analysis computer is configured toprovide a virtual 3D preheater temperature model having each virtual 3Dpreheater level temperature model.

In some embodiments, the imaging analysis computer is configured toprovide a visual representation of each temperature of each preheaterlevel.

In some embodiments, the imaging analysis computer is configured to:image the preheater level with a high definition infrared imagingsensor; and correct the 2D temperature model with temperature data withimages from the high definition infrared imaging sensor. In someaspects, the imaging analysis computer is configured to: obtain at leastone calibration infrared image; determine a difference in temperaturedata between the at least one infrared image and the at least onecalibration infrared image; calibrate the system based on thedifference; and obtain at least one subsequent infrared image based onthe difference in the temperature data between the at least one infraredimage and the at least one calibration infrared image.

In some embodiments, the imaging analysis computer is configured torecord a temperature profile for the preheater level for a defined timeperiod. In some aspects, the imaging analysis computer is configured tocompare a subsequent temperature of the preheater level with thetemperature profile for the preheater level. In some aspects, theimaging analysis computer is configured to: graphically display a graphof the temperature profile for at least a portion of the defined timeperiod; and graphically display a subsequent temperature of thepreheater level in comparison with the graphically displayed graph ofthe temperature profile.

In some embodiments, a system for measuring temperatures of a preheaterof a rotary kiln can include: at least one infrared imaging sensor foreach level of the preheater, wherein the preheater includes at least twopreheater levels; and an imaging analysis computer operably coupled withthe at least one infrared imaging sensor of each level of the preheater.In some aspects, the imaging analysis computer is configured to performthe following for each preheater level: generate at least one baselineinfrared image of a fixed field of view of the preheater level; obtainat least one subsequent infrared image of the fixed field of view of thepreheater level; identify at least one variable temperature region inthe at least one infrared image based on a plurality of pixels in the atleast one subsequent infrared image having a variable difference intemperature from a corresponding plurality of pixels in the at least onebaseline infrared image, wherein the at least one variable temperatureregion includes the plurality of pixels having a baseline temperaturefrom the at least one baseline infrared image and having a subsequenttemperature that is the variable distance in temperature; generate avisual representation of the at least one variable temperature region;and displaying the visual representation that identifies the presence ofthe at least one variable temperature region in the fixed field of view.In some aspects, the imaging analysis computer is configured to generatethe visual representation to include at least one of a 2D image, a 2Dmodel, a 3D model, or graph showing temperature data. In some aspects,the imaging analysis computer is configured to: implement a timedifference between the at least one baseline infrared image and the atleast one subsequent infrared image that is sufficient for a change intemperature of the preheater level to have the variable difference intemperature.

In some embodiments, the imaging analysis computer is configured to:monitor any change in temperature of each pixel of the subsequentinfrared image; compare any change in temperate of each pixel of the atleast one subsequent infrared image with the respective pixel of the atleast one baseline image; generate a visual representation of any changein temperature of each pixel having the change in temperature; anddisplay the visual representation of the change in temperature of eachpixel having the change in temperature. In some embodiments, the imaginganalysis computer is configured to generate an alert that identifies thepresence of the at least one variable temperature region in the fixedfield of view.

In some embodiments, the imaging analysis computer is configured to:generate a data feed of real time temperatures based on the at least onesubsequent infrared image; generate a data feed of real time averagetemperatures of at least one variable temperature region over a definedtime period; generate a visual representation of the data feed of realtime temperatures and data feed of real time average temperatures; andprovide the visual representation of the data feed of real timetemperatures and data feed of real time average temperatures.

In some embodiments, the imaging analysis computer is configured to:determine an input temperature of a gas input component of a firstpreheater level, wherein the gas input component fluidly couples thefirst preheater level with a rotary kiln; generate a visualrepresentation of the input temperature; and provide the visualrepresentation of the input temperature.

Rotary Kiln

In some embodiments, a system for detecting a hotspot on a rotary kilncan include: at least one infrared imaging sensor; and an imaginganalysis computer operably coupled with the at least one infraredimaging sensor. The imaging analysis computer is configured to: obtainat least one baseline infrared image of a fixed field of view of therotary kiln; analyze all pixels in the fixed field of view of the atleast one baseline infrared image for each pixel temperature; determinean acceptable temperature range for each pixel in the fixed field ofview; obtain at least one subsequent infrared image of the fixed fieldof view of the rotary kiln; determine the temperature for all pixels inthe fixed field of view of the at least one subsequent infrared image;determine whether the temperature for each pixel in the at least onesubsequent infrared image is within the acceptable temperature range;when the temperature is within the acceptable range, mark the pixel asnormal; when the temperature is greater than the acceptable range, markthe pixel as abnormal; and generate an alert or cooling protocol whentwo or more adjacent pixels are marked as abnormal and having atemperature outside of the acceptable temperature range in the fixedfield of view.

In some aspects, at least one infrared imaging sensor is directed at atyre assembly of the kiln. In some aspects, the at least one infraredimaging sensor is directed to a tyre gap surface selected from at leastone of: a kiln outer surface under the tyre assembly; a surface of atyre block of the tyre assembly; or an under-surface of a tyre ring ofthe tyre assembly. In some instances, the at least one infrared imagingsensor images at least 75% of the tyre gap surface. In some instances,the system can include a first imaging sensor aimed into a first openend of a first tyre gap and a second imaging sensor aimed into a secondopen end of the first tyre gap.

In some embodiments, the imaging analysis computer is configured to:identify a discrete area on a surface of the kiln in the fixed field ofview; and monitor the discrete area when it passes through the fixedfield of view as the kiln rotates.

In some instances, the imaging analysis computer is configured to:identify a plurality of discrete areas on a surface of the kiln in thefixed field of view that each have a temperature profile; define atemperature fingerprint with a collection of the plurality of discreteareas; and monitor the plurality of discrete areas of the temperaturefingerprint as each passes through the fixed field of view as the kilnrotates. In some instances, the imaging analysis computer is configuredto: identify a first discrete area on the surface of the kiln in the atleast one baseline infrared image of a fixed field of view of the rotarykiln; and identify the first discrete area on the surface of the kiln inthe at least one subsequent infrared image of the fixed field of view ofthe rotary kiln. In some instances, the imaging analysis computer isconfigured to: compare the first discrete area from the at least onebaseline infrared image to the first discrete area from the at least onesubsequent infrared image; and determine differences in temperature foreach pixel of the first discrete area from the at least one baselineinfrared image to the at least one subsequent infrared image. In someinstances, the imaging analysis computer is configured to: determinewhether the first discrete area has a temperature difference greaterthan an allowable temperature difference; and identify the firstdiscrete area as a hotspot when the temperature difference is greaterthan an allowable temperature difference. In some instances, the imaginganalysis computer is configured to: monitor at least one first discreteregion of the tyre assembly and/or region of kiln surface underneath thetyre assembly; and determine a temperature profile for the kiln surfaceunderneath the tyre assembly.

In some embodiments, the imaging analysis computer is configured to:compare the temperature profile with a model that that correlates pixeltemperatures with kiln brick wall thickness; determine an estimated kilnbrick wall thickness based on the temperature of each pixel in thetemperature profile; and generate and provide a report on the kiln brickwall thickness. In some aspects, the report includes: a two or threedimensional simulation of the model of the kiln brick wall showing brickwall thickness; or an alert when at least one region of the kiln brickwall has a thickness below a defined threshold.

In some embodiments, the system includes a cooling system operablycoupled with the imaging analysis computer, wherein the imaging analysiscomputer includes computer executable instructions for controlling thecooling system based on temperature data of obtained from the at leastone infrared imaging sensor. In some aspects, the cooling systemincludes: a sprayer controller; a water source; a pressurizing pumpfluidly coupled with the water source and operably coupled with thesprayer controller; a water supply system fluidly coupled with the watersupply and pressurized by the pressurizing pump; at least one solenoidvalve in the water supply system, wherein the solenoid valve is operablycoupled with the sprayer controller; and at least one nozzle at an endof a spray line of the water supply system, wherein the at least onesolenoid valve controls water sprayed from the at least one nozzle.

In some embodiments, the sprayer controller is configured to: obtainhotspot data for the kiln; identify at least one hotspot to cool with acooling water spray; determine a spraying protocol to cool theidentified at least one hotspot; implement the spraying protocol to coolthe identified at least one hotspot; obtain cooled temperature data forthe at least one hotspot; determine whether a cooled temperature of thehotspot is greater than the acceptable range; when the cooledtemperature is within the acceptable range, terminate the sprayingprotocol; and when the cooled temperature is greater than the acceptablerange, continue the spraying protocol. In some aspects, the hotspot dataincludes at least one of: a location of the hotspot in the kiln; asurface of the kiln having a hotspot thereunder; a temperature of thehotspot; a temperature of the kiln surface over the hotspot; an areasize of the hotspot; an area size of the kiln surface over the hotspot;a temperature gradient of the hotspot; a surface temperature gradient ofthe kiln surface over the hotspot; a change in temperature from abaseline temperature for the hotspot; or a change in temperature from abaseline temperature for the kiln surface over the hotspot. In someaspects, the hotspot data includes current data compared to historicaldata. In some aspects, the historical data includes at least one of:data prior to formation of a hotspot; data from at least one priorrotation of the kiln; data from the current hour; data from the currentday; data from the current week; or data from the current month.

In some embodiments, the sprayer controller is configured to: identify alocation and hotspot data of a specific hotspot on the kiln; anddetermine a spraying protocol for the specific hotspot based at leastone of: a water spray pressure; a distance of a specific water sprayerto the location of the specific hotspot on the kiln surface; timebetween actuating solenoid valve of the specific water sprayer andcontacting resultant water spray on the location of the specifichotspot; duration of the location of the specific hotspot being within aspray region on the kiln surface; duration of opening the solenoidvalve; rotational velocity of the rotating kiln; temperature of sprayedwater; hottest temperature of the specific hotspot; temperature profileof the specific hotspot; temperature gradient and area of the hotspot;temperature of sprayed water as it contacts the location of the specifichotspot; when to initiate spray by actuating the solenoid valve; when toterminate spray by de-actuating the solenoid valve; position of nozzleof sprayer relative to the location of the specific hotspot; area ofhotspot; or area of water spray on the kiln surface. In some aspects,the spraying protocol for the specific hotspot includes: determiningtiming of initiation of actuation of solenoid valve relative to thelocation of the hotspot during rotation of the kiln; determining timeperiod the solenoid valve is opened to spray the cooling water; anddetermining timing of de-actuation of solenoid valve relative to thelocation of the hotspot during rotation of the kiln, such that the waterspray ceases as the hotspot moves out of range of the sprayer.

In some embodiment, the system can include a first imaging sensor ispositioned to have a field of view of a defined area of a surface of thekiln; and the at least one nozzle is positioned to have a spray regionthat is outside of the defined area such that vaporization from thespray region does not pass between the first imaging sensor and thekiln. In some aspects, the first imaging sensor is on a first side ofthe kiln and a corresponding first nozzle is on an opposite side of thekiln or vertically above the first imaging sensor. In some aspects, afirst imaging sensor is positioned to have a field of view of a definedarea of a surface of the kiln and at least one nozzle sprays onto a topportion of the defined area such that vaporization from the spray regiononly passes between the first imaging sensor and top portion of thedefined area. In some aspects, each nozzle is positioned to spray wateronto a defined spray area on the kiln so as to generate water vapor,wherein each infrared imaging sensor is positioned to image the kilnwithout imaging the water vapor. In some aspects, at least one nozzle ispositioned to aim a water spray at the tyre assembly of the kiln. Insome aspects, the at least nozzle is positioned to aim a water spray ata tyre gap surface selected from at least one of: a kiln outer surfaceunder the tyre assembly; a surface of a tyre block of the tyre assembly;or an under-surface of a tyre ring of the tyre assembly.

In some aspects, the at least one nozzle sprays a water spray to coverat least 75% of the tyre gap surface. In some aspects, a first nozzle isaimed into a first open end of a first tyre gap and a nozzle is aimedinto a second open end of the first tyre gap.

In some embodiments, the imaging analysis computer and/or sprayercontroller is configured to: identify a first hotspot on a surface ofthe kiln in the fixed field of view; and spray water from at least onenozzle when the first hotspot passes through a spray region of the atleast one nozzle when the first hotspot is outside of the fixed field ofview. In some aspects, the imaging analysis computer and/or sprayercontroller is configured to: monitor a temperature profile of the firsthotspot before, during, and after the spraying of water thereon;determine whether the temperature profile of the first hotspot includesa temperature within an acceptable range; when the temperature is withinthe acceptable range, the first hotspot is not sprayed during eachrevolution of the kiln; and when the temperature is greater than theacceptable range, the hotspot is sprayed during each revolution of thekiln. In some aspects, the imaging analysis computer and/or sprayercontroller is configured to continuing the cooling the first hotspotwith water sprays until the hotspot includes a temperature within theacceptable range.

In some embodiments, the cooling system can include at least one drivemotor that can change direction of water spray from the at least onenozzle. In some aspects, the imaging analysis computer and/or sprayercontroller is configured to drive the at least one drive motor to changea trajectory of water spray from the at least one nozzle toward at leastone hotspot. In some aspects, the imaging analysis computer and/orsprayer controller is configured to drive the at least one drive motorso that the water spray follows at least one hotspot as the at least onehotspot passes by the at least one nozzle.

In some embodiments, the imaging analysis computer is configured to:determine a temperature of a discrete location of the rotary kiln inreal time; determine whether the temperature is greater than a thresholdtemperature in real time; and generate an alert or cooling protocol inreal time when the temperature is greater than the thresholdtemperature.

In some embodiments, the imaging analysis computer is configured to:analyze all pixels in the fixed field of view for changes from the atleast one baseline infrared image of a defined region of the kiln to atleast one subsequent infrared image having the defined region of thekiln; identify a temperature for each pixel in the field of view betweenthe at least one baseline infrared image and the at least one subsequentinfrared image; identify one or more first pixels in the at least onesubsequent infrared image having a first variable difference intemperature that is greater than an allowable variable difference intemperature for the one or more first pixels in the at least onesubsequent infrared image compared to an allowable variable differencein temperature for the one or more first pixels in the at least onebaseline infrared image; determine the one or more first pixels as beingon or more hotspots based on the first variable difference intemperature of the one or more first pixels being greater than theallowable variable difference in temperature of the one or more firstpixels in the fixed field of view; and generate an alert or coolingprotocol that identifies a hotspot being present in the fixed field ofview.

In some embodiments, the imaging analysis computer is configured toprovide the alert by: actuating an audible indicator; actuating avisible indicator; showing the alert on a display device; ortransmitting the alert to a remote device.

In some embodiments, the imaging analysis computer is configured tomonitor the fixed field of view to detect a hotspot under a tyreassembly of the rotary kiln. In some aspects, the imaging analysiscomputer is configured to: identify a surface region in the fixed fieldof view that is a surface of a tyre assembly, the surface region havinga surface temperature for each pixel; and identify a hotspot region ofthe kiln under the tyre assembly in the fixed field of view that is ahotspot by having a variable difference in temperature for each pixelthat is greater than the allowable variable difference in temperaturefor the surface region from the at least one baseline infrared image tothe at least one subsequent infrared image. In some aspects, the imaginganalysis computer is configured to: determine the surface region in thefixed field of view in the at least one baseline infrared image as beingdevoid of a hotspot, the surface region having the allowable variabledifference in temperature for each pixel; and determine the hotspotregion in the fixed field of view in the at least one subsequentinfrared image as having a hotspot, the hotspot region having the firstvariable difference in temperature that is greater than the allowablevariable difference in temperature for each pixel.

In some embodiments, the imaging analysis computer is configured to:associate adjacent first pixels to identify an hotspot region; determinea size of the hotspot region; and generate a hotspot region size reportthat identifies the size of the hotspot region based on the associatedadjacent first pixels; and compare the area of the hotspot region with athreshold area size and generate the alert or cooling protocol once thehotspot region has an area that is at least the size of the thresholdsize, wherein the threshold area size is a defined value or a percentageof a region of interest.

In some embodiments, the imaging analysis computer is configured toperform at least one of the following: determine whether or not there iswater on the kiln surface and compensate for the water during theanalysis of the pixels in the fixed field of view; determine whether ornot there is water vapor rising from the kiln surface and compensate forthe water vapor during the analysis of the pixels in the fixed field ofview; determining that it is raining in the fixed field of view andmonitoring the fixed field of view to detect hotspots through the water;determine whether or not the water on the kiln has areas of reflectedlight and compensate for the areas of reflected light during theanalysis of the pixels in the fixed field of view; obtain the thermaldata for the one or more surfaces in the fixed field of view and computewith the thermal data for the one or more surfaces in the fixed field ofview during the analysis of the pixels in the fixed field of view;obtain distance data for the one or more surfaces in the fixed field ofview and compute with the distance data for the one or more surfaces inthe fixed field of view during the analysis of the pixels in the fixedfield of view; or determine a relative humidity and compute with therelative humidity during the analysis of the pixels in the fixed fieldof view.

In some embodiments, the imaging analysis computer is configured toobtain the at least one baseline infrared image by: acquiring a seriesof infrared images of the fixed field of view; analyzing pixel data ofeach infrared image of the series to determine a pixel temperature foreach pixel for each infrared image; determining a range of pixeltemperatures for each pixel without a hotspot being present in the fixedfield of view across the series of infrared images of the fixed field ofview; and setting the allowable variable difference in temperature toinclude the determined range of pixel temperatures for each pixelwithout a hotspot.

In some embodiments, the imaging analysis computer is configured toobtain the at least one baseline infrared image by: performing astatistical analysis of the range of pixel temperatures for each pixelwithout a hotspot being present in at least one region across the seriesof infrared images of the fixed field of view for the at least oneregion to determine an allowable distribution of pixel temperatures foreach pixel; and setting the at least one baseline infrared image so thateach pixel includes the allowable distribution of pixel temperatures. Insome aspects, the at least one baseline infrared image is a model ofeach pixel with the allowable distribution of pixel temperatures foreach pixel, wherein the model of pixel is obtained by: determining adistribution of the pixel temperatures for each pixel without a hotspotbeing present across the series of infrared images for the at least oneregion; identifying a maximum pixel temperature that is greater than thedistribution of pixel temperatures by a first difference; and settingthe first difference from the distribution to indicate absence of ahotspot for each pixel in the at least one region.

In some embodiments, the imaging analysis computer is configured to:compare each pixel temperature in the one or more subsequent infraredimages for the at least one region with the model of each pixel with theallowable distribution of pixel temperatures; determine a differencebetween each pixel temperature in the one or more subsequent infraredimages and the model of each pixel in the at least one region; determinewhether the difference is greater than a threshold difference, when thedifference is greater than the threshold difference, determine that thepixel is a hotspot pixel, or when the difference is less than thethreshold difference, determine that the pixel is not a hotspot pixel.In some aspects, the imaging analysis computer is configured to:determine a standard deviation of the distribution of the pixeltemperatures for each pixel without a hotspot being present across theseries of infrared images; and set the threshold difference as being adefined difference from the standard deviation.

In some embodiments, the imaging analysis computer is configured to:obtain the at least baseline one infrared image of the fixed field ofview of a specific rotational position of the rotary kiln such that aspecific region of the rotary kiln is imaged by a plurality of specificpixels; obtain the at least one subsequent infrared image of the fixedfield of view of the specific rotational position of the rotary kilnsuch that the specific region of the rotary kiln is imaged by theplurality of specific pixels; and compare the at least baseline oneinfrared image and the at least one subsequent infrared image so as tocompare the specific region of the rotary kiln by the plurality ofspecific pixels. In some aspects, each rotational position of the rotarykiln is imaged as it rotates, and the comparison is made with eachrotational position in the at least one baseline image and the at leastone subsequent image. In some aspects, a first baseline image of aspecific region of the rotary kiln is obtained at least one revolutionprior to a first subsequent image of the specific region. In someaspects, the specific region includes a specific set of pixels in thefirst baseline image and the first subsequent image. In some aspects,the at least one baseline image is not compared to a subsequent image ofa different region of the rotary kiln. In some aspects, a physicalfeature of the rotary kiln is identified, wherein the imaging analysiscomputer is configured to track the physical feature as it rotates. Insome aspects, at least one tyre gap of a tyre assembly is identified andmapped in relation to the physical feature. In some aspects, the imaginganalysis computer is configured to track each tyre gap of the tyreassembly. In some aspects, the imaging analysis computer is configuredto label each tyre gap for tracking purposes. In some aspects, imaginganalysis computer is configured to identify a plurality of referencepoints on the surface of the rotary kiln and track the plurality ofreference points as the rotary kiln rotates. In some aspects, theimaging analysis computer is configured to a reference a tyre gap to atleast one of the reference points. In some aspects, the system canperform tracking of the rotation of the rotary kiln by tracking at leastone of the reference points and/or at least one tyre gap.

In some embodiments, the imaging analysis computer is configured receiveinput of parameters of the rotary kiln, wherein the parameters includeat least a measurement of dimension of the rotary kiln and at least arotational velocity of the rotary kiln. In some aspects, the dimensionsinclude a diameter of the rotary kiln. In some aspects, the imaginganalysis computer is configured to use the parameters in calculationsfor temperature profile measurements. In some aspects, the imaginganalysis computer is configured to use the parameters in calculating arotational velocity of the rotary kiln. In some aspects, the rotationalvelocity is in rotations per minutes.

In some embodiments, the at least one infrared imaging sensor includes acooled housing. In some aspects, the cooled housing includes a fluidinlet, a fluid outlet, and a fluid conduit between the fluid inlet andfluid outlet. In some aspects, the fluid inlet is coupled to a coolingfluid source. In some aspects, the cooling fluid is cooled water. Insome aspects, the cooling fluid is provided by a cooling systemconfigured to cool the cooling fluid.

In some embodiments, a system for detecting a hotspot of a rotary kilncan include: at least one infrared imaging sensor, wherein the at leastone infrared imaging sensor is a infrared camera configured fordetecting absorption in the IR bandwidth, each infrared imaging sensorbeing configured to capture infrared images of a scene of a rotary kiln,each infrared image comprising a plurality of pixels, each pixel of eachinfrared image having a corresponding pixel value; an imaging analysiscomputer operably coupled with the at least one infrared imaging sensor,wherein the imaging analysis computer is configured to: generate atleast one baseline infrared image of a fixed field of view of the scenewithout the hotspot being present; obtain at least one subsequentinfrared image of a fixed field of view of the scene; identify at leastone hotspot region in the at least one infrared image based on aplurality of pixels in the at least one subsequent infrared image havinga variable difference from a corresponding plurality of pixels in the atleast one baseline infrared image, wherein the at least one hotspotregion includes the plurality of pixels having temperature data from theinfrared bandwidth; determine the at least one elevated temperatureregion as being a hotspot; and generate an alert that identifies thepresence of the hotspot in the fixed field of view.

In some embodiments, a system for temperature monitoring and detectingabnormally high temperatures of an industrial process can be used for arotary kiln. The system can include: a plurality of infrared imagingsensors, each infrared imaging sensor configured to capture sequences ofinfrared images of a scene, each infrared image comprising a pluralityof pixels, each pixel having a corresponding pixel value; an imaginganalysis computer comprising: an electronic hardware processor, anelectronic hardware memory operably connected to the electronic hardwareprocessor and storing instructions that configure the electronichardware processor to: receive a sequence of a plurality of infraredimages of the scene from each infrared imaging sensor of the pluralityof infrared imaging sensors for a period of time, wherein each pixelcorresponds with a same point of the scene across the sequence of theplurality of infrared images, determine a temperature value for eachpixel corresponding to the pixel value of each pixel for each of theplurality of infrared images in the sequences of infrared images for theperiod of time, determine a statistical distribution of temperaturevalues for each pixel over the plurality of infrared images based on thedetermined temperature value of each pixel of each infrared image of theplurality of infrared images for the period of time, which is defined asa historical time period, such that each pixel includes a separatestatistical distribution of temperature values for the historical timeperiod, define a threshold distance from the statistical distribution oftemperature values for each pixel, the threshold distance being greaterthan the statistical distribution of temperature values, obtain asubsequent infrared image from at least one infrared imaging sensor ofthe plurality of infrared imaging sensors, determine a subsequenttemperature value of each pixel in the subsequent infrared image,compare the determined subsequent temperature value of each pixel withthe threshold distance from the statistical distribution of temperaturevalues for each pixel, when the determined subsequent temperature valuefor a first pixel is less than the threshold distance from thestatistical distribution of temperature values for the first pixel,update the statistical distribution of temperature values for the firstpixel with the determined subsequent temperature value to form anupdated statistical distribution of temperature values for an updatedhistorical time period, when the determined subsequent temperature valuefor the first pixel is greater than the threshold distance from thestatistical distribution of temperature values for the first pixel,perform the following steps: identify a plurality of first pixels in thesubsequent image that each have a determined subsequent temperaturevalue that is greater than the threshold distance from the statisticaldistribution of temperature values for the plurality of first pixels,determine each pixel of the plurality of first pixels to be abnormalpixels, each abnormal pixel of the plurality of first pixels having thedetermined temperature value being greater than the threshold distancefrom its respective statistical distribution of temperature values forthe historical time period, associate adjacent abnormal pixels of theplurality of first pixels to identify an abnormal region, evaluate asize of the abnormal region, and generate an alert based on a comparisonof the size of the abnormal region to at least one of: a size of aregion of interest and a predetermined size, wherein the alert isgenerated when the size of the abnormal region is larger than: the sizeof the region of interest or the predetermined size. Thus, the hotspotsof a rotary kiln can be monitored and alerts can be generated once ahotspot is either identified or matures to a size or temperature that isabove a threshold.

Preheater and Rotary Kiln

In some embodiments, a system for measuring temperatures of a preheaterand rotary kiln can include: at least one infrared imaging sensor foreach level of the preheater, wherein the preheater includes at least twopreheater levels; at least one infrared imaging sensor for the rotarykiln; and an imaging analysis computer operably coupled with the atleast one infrared imaging sensor of each level of the preheater androtary kiln. In some aspects, the imaging analysis computer isconfigured to perform the following for each preheater level and rotarykiln: obtain a 3D model of a preheater level of the preheater; obtain a3D model of the rotary kiln; obtain at least one infrared image of afixed field of view of the preheater level of the preheater; obtain atleast one infrared image of a fixed field of view of the preheater levelof the preheater; analyze all pixels in the fixed field of view of theat least one infrared image of the preheater level for each pixeltemperature; analyze all pixels in the fixed field of view of the atleast one infrared image of the preheater level for each pixeltemperature; generate a 2D temperature model for the preheater level;generate a 2D temperature model for the rotary kiln; overlaying the 2Dtemperature model of the preheater level over the 3D model of thepreheater level to generate a virtual 3D preheater level temperaturemodel; overlaying the 2D temperature model of the rotary kiln over the3D model of the rotary kiln to generate a virtual 3D rotary kilntemperature model; and providing a visual representation of the virtual3D preheater level temperature model and a visual representation of thevirtual 3D rotary kiln temperature model. In some aspects, the imaginganalysis computer is configured to: generate a graphical user interfacethat shows the virtual 3D rotary kiln temperature model; generating amenu option of the graphical user interface for selecting viewing of thevirtual 3D preheater level model with or without being coupled with thevirtual 3D rotary kiln model; and display the graphical user interfaceon a display.

In some embodiments, a system for measuring temperatures of a preheaterof a rotary kiln can include: at least one infrared imaging sensor foreach level of the preheater, wherein the preheater includes at least twopreheater levels; at least one infrared imaging sensor for the rotarykiln; and an imaging analysis computer operably coupled with the atleast one infrared imaging sensor of each level of the preheater androtary kiln. In some aspects, the imaging analysis computer isconfigured to perform the following for each preheater level and rotarykiln: generate at least one baseline infrared image of a fixed field ofview of the preheater level; generate at least one baseline infraredimage of a fixed field of view of the rotary kiln; obtain at least onesubsequent infrared image of the fixed field of view of the preheaterlevel; obtain at least one subsequent infrared image of the fixed fieldof view of the rotary kiln; identify at least one variable temperatureregion in the at least one infrared image of the preheater level orrotary kiln based on a plurality of pixels in the at least onesubsequent infrared image of the preheater level or rotary kiln having avariable difference in temperature from a corresponding plurality ofpixels in the at least one baseline infrared image of the preheaterlevel or rotary kiln, wherein the at least one variable temperatureregion includes the plurality of pixels having a baseline temperatureand having a subsequent temperature that is the variable distance intemperature; generate a visual representation of the at least onevariable temperature region of the preheater level or rotary kiln; anddisplay the visual representation that identifies the presence of the atleast one variable temperature region in the fixed field of view of thepreheater level or rotary kiln. In some aspects, the imaging analysiscomputer is configured to: determine an input temperature of a gas inputcomponent of a first preheater level, wherein the gas input componentfluidly couples the first preheater level with the rotary kiln; generatea visual representation of the input temperature; and provide the visualrepresentation of the input temperature. In some aspects, the imaginganalysis computer is configured to generate the visual representation toinclude at least one of a 2D image, a 2D model, a 3D model, or graphshowing temperature data. In some aspects, the imaging analysis computeris configured to implement a time difference between the at least onebaseline infrared image and the at least one subsequent infrared imagethat is sufficient for a change in temperature of the preheater level orrotary kiln to have the variable difference in temperature.

In some embodiments, the imaging analysis computer is configured to:monitor any change in temperature of each pixel of the subsequentinfrared image of the preheater level and/or rotary kiln; compare anychange in temperate of each pixel of the at least one subsequentinfrared image of the preheater level and/or rotary kiln with therespective pixel of the at least one baseline image of the preheaterlevel and/or rotary kiln; generate a visual representation of any changein temperature of each pixel having the change in temperature; anddisplay the visual representation of the change in temperature of eachpixel having the change in temperature. In some aspects, the imaginganalysis computer is configured to generate an alert that identifies thepresence of the at least one variable temperature region in the fixedfield of view of the preheater level and/or rotary kiln.

In some embodiments, the imaging analysis computer is configured to:generate a data feed of real time temperatures based on the at least onesubsequent infrared image of the preheater level and/or rotary kiln;generate a data feed of real time average temperatures based on the atleast one baseline infrared image and the at least one subsequentinfrared image of the preheater level and/or rotary kiln; generate avisual representation of the data feed of real time temperatures anddata feed of real time average temperatures; and provide the visualrepresentation of the data feed of real time temperatures and data feedof real time average temperatures.

In some embodiments, the imaging analysis computer is configured to:generate a graphical user interface that shows temperature data of therotary kiln; generating a menu option of the graphical user interfacefor selecting viewing of the temperature data of the preheater levelwith or without being associated with the temperature data of the rotarykiln; and display the graphical user interface on a display.

The present disclosure is not to be limited in terms of the particularembodiments described in this application, which are intended asillustrations of various aspects. Many modifications and variations canbe made without departing from its spirit and scope. Functionallyequivalent methods and apparatuses within the scope of the disclosure,in addition to those enumerated herein, are possible from the foregoingdescriptions. Such modifications and variations are intended to fallwithin the scope of the appended claims. The present disclosure is to belimited only by the terms of the appended claims, along with the fullscope of equivalents to which such claims are entitled. The terminologyused herein is for the purpose of describing particular embodimentsonly, and is not intended to be limiting.

In one embodiment, the present methods can include aspects performed ona computing system. As such, the computing system can include a memorydevice that has the computer-executable instructions for performing themethods. The computer-executable instructions can be part of a computerprogram product that includes one or more algorithms for performing anyof the methods of any of the claims.

In one embodiment, any of the operations, processes, or methods,described herein can be performed or cause to be performed in responseto execution of computer-readable instructions stored on acomputer-readable medium and executable by one or more processors. Thecomputer-readable instructions can be executed by a processor of a widerange of computing systems from desktop computing systems, portablecomputing systems, tablet computing systems, hand-held computingsystems, as well as network elements, and/or any other computing device.The computer readable medium is not transitory. The computer readablemedium is a physical medium having the computer-readable instructionsstored therein so as to be physically readable from the physical mediumby the computer/processor.

There are various vehicles by which processes and/or systems and/orother technologies described herein can be effected (e.g., hardware,software, and/or firmware), and that the preferred vehicle may vary withthe context in which the processes and/or systems and/or othertechnologies are deployed. For example, if an implementer determinesthat speed and accuracy are paramount, the implementer may opt for amainly hardware and/or firmware vehicle; if flexibility is paramount,the implementer may opt for a mainly software implementation; or, yetagain alternatively, the implementer may opt for some combination ofhardware, software, and/or firmware.

The various operations described herein can be implemented, individuallyand/or collectively, by a wide range of hardware, software, firmware, orvirtually any combination thereof. In one embodiment, several portionsof the subject matter described herein may be implemented viaapplication specific integrated circuits (ASICs), field programmablegate arrays (FPGAs), digital signal processors (DSPs), or otherintegrated formats. However, some aspects of the embodiments disclosedherein, in whole or in part, can be equivalently implemented inintegrated circuits, as one or more computer programs running on one ormore computers (e.g., as one or more programs running on one or morecomputer systems), as one or more programs running on one or moreprocessors (e.g., as one or more programs running on one or moremicroprocessors), as firmware, or as virtually any combination thereof,and that designing the circuitry and/or writing the code for thesoftware and/or firmware are possible in light of this disclosure. Inaddition, the mechanisms of the subject matter described herein arecapable of being distributed as a program product in a variety of forms,and that an illustrative embodiment of the subject matter describedherein applies regardless of the particular type of signal bearingmedium used to actually carry out the distribution. Examples of aphysical signal bearing medium include, but are not limited to, thefollowing: a recordable type medium such as a floppy disk, a hard diskdrive (HDD), a compact disc (CD), a digital versatile disc (DVD), adigital tape, a computer memory, or any other physical medium that isnot transitory or a transmission. Examples of physical media havingcomputer-readable instructions omit transitory or transmission typemedia such as a digital and/or an analog communication medium (e.g., afiber optic cable, a waveguide, a wired communication link, a wirelesscommunication link, etc.).

It is common to describe devices and/or processes in the fashion setforth herein, and thereafter use engineering practices to integrate suchdescribed devices and/or processes into data processing systems. Thatis, at least a portion of the devices and/or processes described hereincan be integrated into a data processing system via a reasonable amountof experimentation. A typical data processing system generally includesone or more of a system unit housing, a video display device, a memorysuch as volatile and non-volatile memory, processors such asmicroprocessors and digital signal processors, computational entitiessuch as operating systems, drivers, graphical user interfaces, andapplications programs, one or more interaction devices, such as a touchpad or screen, and/or control systems, including feedback loops andcontrol motors (e.g., feedback for sensing position and/or velocity;control motors for moving and/or adjusting components and/orquantities). A typical data processing system may be implementedutilizing any suitable commercially available components, such as thosegenerally found in data computing/communication and/or networkcomputing/communication systems.

The herein described subject matter sometimes illustrates differentcomponents contained within, or connected with, different othercomponents. Such depicted architectures are merely exemplary, and thatin fact, many other architectures can be implemented which achieve thesame functionality. In a conceptual sense, any arrangement of componentsto achieve the same functionality is effectively “associated” such thatthe desired functionality is achieved. Hence, any two components hereincombined to achieve a particular functionality can be seen as“associated with” each other such that the desired functionality isachieved, irrespective of architectures or intermedial components.Likewise, any two components so associated can also be viewed as being“operably connected”, or “operably coupled”, to each other to achievethe desired functionality, and any two components capable of being soassociated can also be viewed as being “operably couplable”, to eachother to achieve the desired functionality. Specific examples ofoperably couplable include, but are not limited to: physically mateableand/or physically interacting components and/or wirelessly interactableand/or wirelessly interacting components and/or logically interactingand/or logically interactable components.

FIG. 6 shows an example computing device 600 (e.g., a computer) that maybe arranged in some embodiments to perform the methods (or portionsthereof) described herein. In a very basic configuration 602, computingdevice 600 generally includes one or more processors 604 and a systemmemory 606. A memory bus 608 may be used for communicating betweenprocessor 604 and system memory 606.

Depending on the desired configuration, processor 604 may be of any typeincluding, but not limited to: a microprocessor (μP), a microcontroller(μC), a digital signal processor (DSP), or any combination thereof.Processor 604 may include one or more levels of caching, such as a levelone cache 610 and a level two cache 612, a processor core 614, andregisters 616. An example processor core 614 may include an arithmeticlogic unit (ALU), a floating point unit (FPU), a digital signalprocessing core (DSP Core), or any combination thereof. An examplememory controller 618 may also be used with processor 604, or in someimplementations, memory controller 618 may be an internal part ofprocessor 604.

Depending on the desired configuration, system memory 606 may be of anytype including, but not limited to: volatile memory (such as RAM),non-volatile memory (such as ROM, flash memory, etc.), or anycombination thereof. System memory 606 may include an operating system620, one or more applications 622, and program data 624. Application 622may include a determination application 626 that is arranged to performthe operations as described herein, including those described withrespect to methods described herein. The determination application 626can obtain data, such as pressure, flow rate, and/or temperature, andthen determine a change to the system to change the pressure, flow rate,and/or temperature.

Computing device 600 may have additional features or functionality, andadditional interfaces to facilitate communications between basicconfiguration 602 and any required devices and interfaces. For example,a bus/interface controller 630 may be used to facilitate communicationsbetween basic configuration 602 and one or more data storage devices 632via a storage interface bus 634. Data storage devices 632 may beremovable storage devices 636, non-removable storage devices 638, or acombination thereof. Examples of removable storage and non-removablestorage devices include: magnetic disk devices such as flexible diskdrives and hard-disk drives (HDD), optical disk drives such as compactdisk (CD) drives or digital versatile disk (DVD) drives, solid statedrives (SSD), and tape drives to name a few. Example computer storagemedia may include: volatile and non-volatile, removable andnon-removable media implemented in any method or technology for storageof information, such as computer readable instructions, data structures,program modules, or other data.

System memory 606, removable storage devices 636 and non-removablestorage devices 638 are examples of computer storage media. Computerstorage media includes, but is not limited to: RAM, ROM, EEPROM, flashmemory or other memory technology, CD-ROM, digital versatile disks (DVD)or other optical storage, magnetic cassettes, magnetic tape, magneticdisk storage or other magnetic storage devices, or any other mediumwhich may be used to store the desired information and which may beaccessed by computing device 600. Any such computer storage media may bepart of computing device 600.

Computing device 600 may also include an interface bus 640 forfacilitating communication from various interface devices (e.g., outputdevices 642, peripheral interfaces 644, and communication devices 646)to basic configuration 602 via bus/interface controller 630. Exampleoutput devices 642 include a graphics processing unit 648 and an audioprocessing unit 650, which may be configured to communicate to variousexternal devices such as a display or speakers via one or more A/V ports652. Example peripheral interfaces 644 include a serial interfacecontroller 654 or a parallel interface controller 656, which may beconfigured to communicate with external devices such as input devices(e.g., keyboard, mouse, pen, voice input device, touch input device,etc.) or other peripheral devices (e.g., printer, scanner, etc.) via oneor more I/O ports 658. An example communication device 646 includes anetwork controller 660, which may be arranged to facilitatecommunications with one or more other computing devices 662 over anetwork communication link via one or more communication ports 664.

The network communication link may be one example of a communicationmedia. Communication media may generally be embodied by computerreadable instructions, data structures, program modules, or other datain a modulated data signal, such as a carrier wave or other transportmechanism, and may include any information delivery media. A “modulateddata signal” may be a signal that has one or more of its characteristicsset or changed in such a manner as to encode information in the signal.By way of example, and not limitation, communication media may includewired media such as a wired network or direct-wired connection, andwireless media such as acoustic, radio frequency (RF), microwave,infrared (IR), and other wireless media. The term computer readablemedia as used herein may include both storage media and communicationmedia.

Computing device 600 may be implemented as a portion of a small-formfactor portable (or mobile) electronic device such as a cell phone, apersonal data assistant (PDA), a personal media player device, awireless web-watch device, a personal headset device, an applicationspecific device, or a hybrid device that includes any of the abovefunctions. Computing device 600 may also be implemented as a personalcomputer including both laptop computer and non-laptop computerconfigurations. The computing device 600 can also be any type of networkcomputing device. The computing device 600 can also be an automatedsystem as described herein.

The embodiments described herein may include the use of a specialpurpose or general-purpose computer including various computer hardwareor software modules.

Embodiments within the scope of the present invention also includecomputer-readable media for carrying or having computer-executableinstructions or data structures stored thereon. Such computer-readablemedia can be any available media that can be accessed by a generalpurpose or special purpose computer. By way of example, and notlimitation, such computer-readable media can comprise RAM, ROM, EEPROM,CD-ROM or other optical disk storage, magnetic disk storage or othermagnetic storage devices, or any other medium which can be used to carryor store desired program code means in the form of computer-executableinstructions or data structures and which can be accessed by a generalpurpose or special purpose computer. When information is transferred orprovided over a network or another communications connection (eitherhardwired, wireless, or a combination of hardwired or wireless) to acomputer, the computer properly views the connection as acomputer-readable medium. Thus, any such connection is properly termed acomputer-readable medium. Combinations of the above should also beincluded within the scope of computer-readable media.

Computer-executable instructions comprise, for example, instructions anddata which cause a general purpose computer, special purpose computer,or special purpose processing device to perform a certain function orgroup of functions. Although the subject matter has been described inlanguage specific to structural features and/or methodological acts, itis to be understood that the subject matter defined in the appendedclaims is not necessarily limited to the specific features or actsdescribed above. Rather, the specific features and acts described aboveare disclosed as example forms of implementing the claims.

As used herein, the term “determining” encompasses a wide variety ofactions. For example, “determining” may include calculating, computing,processing, deriving, investigating, looking up (e.g., looking up in atable, a database or another data structure), ascertaining and the like.Also, “determining” may include receiving (e.g., receiving information),accessing (e.g., accessing data in a memory) and the like. Also,“determining” may include resolving, selecting, choosing, establishingand the like. Further, a “channel width” as used herein may encompass ormay also be referred to as a bandwidth in certain aspects.

With respect to the use of substantially any plural and/or singularterms herein, those having skill in the art can translate from theplural to the singular and/or from the singular to the plural as isappropriate to the context and/or application. The varioussingular/plural permutations may be expressly set forth herein for sakeof clarity.

It will be understood by those within the art that, in general, termsused herein, and especially in the appended claims (e.g., bodies of theappended claims) are generally intended as “open” terms (e.g., the term“including” should be interpreted as “including but not limited to,” theterm “having” should be interpreted as “having at least,” the term“includes” should be interpreted as “includes but is not limited to,”etc.). It will be further understood by those within the art that if aspecific number of an introduced claim recitation is intended, such anintent will be explicitly recited in the claim, and in the absence ofsuch recitation, no such intent is present. For example, as an aid tounderstanding, the following appended claims may contain usage of theintroductory phrases “at least one” and “one or more” to introduce claimrecitations. However, the use of such phrases should not be construed toimply that the introduction of a claim recitation by the indefinitearticles “a” or “an” limits any particular claim containing suchintroduced claim recitation to embodiments containing only one suchrecitation, even when the same claim includes the introductory phrases“one or more” or “at least one” and indefinite articles such as “a” or“an” (e.g., “a” and/or “an” should be interpreted to mean “at least one”or “one or more”); the same holds true for the use of definite articlesused to introduce claim recitations. In addition, even if a specificnumber of an introduced claim recitation is explicitly recited, thoseskilled in the art will recognize that such recitation should beinterpreted to mean at least the recited number (e.g., the barerecitation of “two recitations,” without other modifiers, means at leasttwo recitations, or two or more recitations). Furthermore, in thoseinstances where a convention analogous to “at least one of A, B, and C,etc.” is used, in general, such a construction is intended in the senseone having skill in the art would understand the convention (e.g., “asystem having at least one of A, B, and C” would include but not belimited to systems that have A alone, B alone, C alone, A and Btogether, A and C together, B and C together, and/or A, B, and Ctogether, etc.). It will be further understood by those within the artthat virtually any disjunctive word and/or phrase presenting two or morealternative terms, whether in the description, claims, or drawings,should be understood to contemplate the possibilities of including oneof the terms, either of the terms, or both terms. For example, thephrase “A or B” will be understood to include the possibilities of “A”or “B” or “A and B.”

In addition, where features or aspects of the disclosure are describedin terms of Markush groups, those skilled in the art will recognize thatthe disclosure is also thereby described in terms of any individualmember or subgroup of members of the Markush group.

As will be understood by one skilled in the art, for any and allpurposes, such as in terms of providing a written description, allranges disclosed herein also encompass any and all possible subrangesand combinations of subranges thereof. Any listed range can be easilyrecognized as sufficiently describing and enabling the same range beingbroken down into at least equal halves, thirds, quarters, fifths,tenths, etc. As a non-limiting example, each range discussed herein canbe readily broken down into a lower third, middle third and upper third,etc. As will also be understood by one skilled in the art all languagesuch as “up to,” “at least,” and the like include the number recited andrefer to ranges which can be subsequently broken down into subranges asdiscussed above. Finally, as will be understood by one skilled in theart, a range includes each individual member. Thus, for example, a grouphaving 1-3 cells refers to groups having 1, 2, or 3 cells. Similarly, agroup having 1-5 cells refers to groups having 1, 2, 3, 4, or 5 cells,and so forth.

From the foregoing, it will be appreciated that various embodiments ofthe present disclosure have been described herein for purposes ofillustration, and that various modifications may be made withoutdeparting from the scope and spirit of the present disclosure.Accordingly, the various embodiments disclosed herein are not intendedto be limiting, with the true scope and spirit being indicated by thefollowing claims.

The invention claimed is:
 1. A system for measuring temperatures of apreheater of a rotary kiln, comprising: at least one infrared imagingsensor for each level of the preheater, wherein the preheater includesat least two preheater levels; and an imaging analysis computer operablycoupled with the at least one infrared imaging sensor of each level ofthe preheater, wherein the imaging analysis computer is configured toperform the following for each preheater level: obtain a 3D model of apreheater level of the preheater; obtain at least one infrared image ofa fixed field of view of the preheater level of the preheater; analyzeall pixels in the fixed field of view of the at least one infrared imagefor each pixel temperature; generate a 2D temperature model of thepreheater level; overlay the 2D temperature model over the 3D model togenerate a virtual 3D preheater level temperature model; and provide avisual representation of the virtual 3D preheater level temperaturemodel.
 2. The system of claim 1, wherein the imaging analysis computeris configured to: obtain dimensions of the preheater level of thepreheater; and size the 3D model of the preheater level of the preheaterwith the dimensions.
 3. The system of claim 1, wherein the imaginganalysis computer is configured to: generate the visual representationof the virtual 3D preheater level temperature model to include the atleast one infrared imaging sensor at a location of the preheater level.4. The system of claim 1, wherein the fixed field of view includes atleast a portion of a preheater level vessel.
 5. The system of claim 1,wherein the imaging analysis computer is configured to: provide the avisual representation of the virtual 3D preheater level temperaturemodel in a first color palette; and modify the first color palette to asecond color palette.
 6. The system of claim 5, wherein the imaginganalysis computer is configured to: generate one of the first or secondcolor palette to be a same color palette of a virtual 3D rotary kilntemperature model.
 7. The system of claim 1, wherein the imaginganalysis computer is configured to: provide a virtual 3D preheatertemperature model having each virtual 3D preheater level temperaturemodel.
 8. The system of claim 1, wherein the imaging analysis computeris configured to: provide a visual representation of each temperature ofeach preheater level.
 9. The system of claim 1, wherein the imaginganalysis computer is configured to: image the preheater level with ahigh definition infrared imaging sensor; and correct the 2D temperaturemodel with temperature data with images from the high definitioninfrared imaging sensor.
 10. The system of claim 1, wherein the imaginganalysis computer is configured to: obtain at least one calibrationinfrared image; determine a difference in temperature data between theat least one infrared image and the at least one calibration infraredimage; calibrate the system based on the difference; and obtain at leastone subsequent infrared image based on the difference in the temperaturedata between the at least one infrared image and the at least onecalibration infrared image.
 11. The system of claim 1, wherein theimaging analysis computer is configured to: record a temperature profilefor the preheater level for a defined time period.
 12. The system ofclaim 11, wherein the imaging analysis computer is configured to:compare a subsequent temperature of the preheater level with thetemperature profile for the preheater level.
 13. The system of claim 11,wherein the imaging analysis computer is configured to: graphicallydisplay a graph of the temperature profile for at least a portion of thedefined time period; and graphically display a subsequent temperature ofthe preheater level in comparison with the graphically displayed graphof the temperature profile.
 14. The system of claim 1, wherein theimaging analysis computer is configured to: determine an inputtemperature of a gas input component of a first preheater level, whereinthe gas input component fluidly couples the first preheater level with arotary kiln; generate a visual representation of the input temperature;and provide the visual representation of the input temperature.
 15. Asystem for measuring temperatures of a preheater of a rotary kiln,comprising: at least one infrared imaging sensor for each level of thepreheater, wherein the preheater includes at least two preheater levels;and an imaging analysis computer operably coupled with the at least oneinfrared imaging sensor of each level of the preheater, wherein theimaging analysis computer is configured to perform the following foreach preheater level: generate at least one baseline infrared image of afixed field of view of the preheater level; obtain at least onesubsequent infrared image of the fixed field of view of the preheaterlevel; identify at least one variable temperature region in the at leastone infrared image based on a plurality of pixels in the at least onesubsequent infrared image having a variable difference in temperaturefrom a corresponding plurality of pixels in the at least one baselineinfrared image, wherein the at least one variable temperature regionincludes the plurality of pixels having a baseline temperature from theat least one baseline infrared image and having a subsequent temperaturethat is the variable distance in temperature; generate a visualrepresentation of the at least one variable temperature region; anddisplay the visual representation that identifies the presence of the atleast one variable temperature region in the fixed field of view. 16.The system of claim 15, wherein the imaging analysis computer isconfigured to: generate the visual representation to include at leastone of a 2D image, a 2D model, a 3D model, or graph showing temperaturedata.
 17. The system of claim 15, wherein the imaging analysis computeris configured to: implement a time difference between the at least onebaseline infrared image and the at least one subsequent infrared imagethat is sufficient for a change in temperature of the preheater level tohave the variable difference in temperature.
 18. The system of claim 15,wherein the imaging analysis computer is configured to: monitor anychange in temperature of each pixel of the subsequent infrared image;compare any change in temperate of each pixel of the at least onesubsequent infrared image with the respective pixel of the at least onebaseline image; generate a visual representation of any change intemperature of each pixel having the change in temperature; and displaythe visual representation of the change in temperature of each pixelhaving the change in temperature.
 19. The system of claim 15, whereinthe imaging analysis computer is configured to: generate an alert thatidentifies the presence of the at least one variable temperature regionin the fixed field of view.
 20. The system of claim 15, wherein theimaging analysis computer is configured to: generate a data feed of realtime temperatures based on the at least one subsequent infrared image;generate a data feed of real time average temperatures of at least onevariable temperature region over a defined time period; generate avisual representation of the data feed of real time temperatures anddata feed of real time average temperatures; and provide the visualrepresentation of the data feed of real time temperatures and data feedof real time average temperatures.
 21. A system for measuringtemperatures of a preheater and rotary kiln, comprising: at least oneinfrared imaging sensor for each level of the preheater, wherein thepreheater includes at least two preheater levels; at least one infraredimaging sensor for the rotary kiln; and an imaging analysis computeroperably coupled with the at least one infrared imaging sensor of eachlevel of the preheater and rotary kiln, wherein the imaging analysiscomputer is configured to perform the following for each preheater leveland rotary kiln: obtain a 3D model of a preheater level of thepreheater; obtain a 3D model of the rotary kiln; obtain at least oneinfrared image of a fixed field of view of the preheater level of thepreheater; obtain at least one infrared image of a fixed field of viewof the preheater level of the preheater; analyze all pixels in the fixedfield of view of the at least one infrared image of the preheater levelfor each pixel temperature; analyze all pixels in the fixed field ofview of the at least one infrared image of the preheater level for eachpixel temperature; generate a 2D temperature model for the preheaterlevel; generate a 2D temperature model for the rotary kiln; overlay the2D temperature model of the preheater level over the 3D model of thepreheater level to generate a virtual 3D preheater level temperaturemodel; overlay the 2D temperature model of the rotary kiln over the 3Dmodel of the rotary kiln to generate a virtual 3D rotary kilntemperature model; and provide a visual representation of the virtual 3Dpreheater level temperature model and a visual representation of thevirtual 3D rotary kiln temperature model.
 22. The method of claim 21,wherein the imaging analysis computer is configured to: generate agraphical user interface that shows the virtual 3D rotary kilntemperature model; generate a menu option of the graphical userinterface for selecting viewing of the virtual 3D preheater level modelwith or without being coupled with the virtual 3D rotary kiln model; anddisplay the graphical user interface on a display.
 23. A system formeasuring temperatures of a preheater of a rotary kiln, comprising: atleast one infrared imaging sensor for each level of the preheater,wherein the preheater includes at least two preheater levels; at leastone infrared imaging sensor for the rotary kiln; and an imaging analysiscomputer operably coupled with the at least one infrared imaging sensorof each level of the preheater and rotary kiln, wherein the imaginganalysis computer is configured to perform the following for eachpreheater level and rotary kiln: generate at least one baseline infraredimage of a fixed field of view of the preheater level; generate at leastone baseline infrared image of a fixed field of view of the rotary kiln;obtain at least one subsequent infrared image of the fixed field of viewof the preheater level; obtain at least one subsequent infrared image ofthe fixed field of view of the rotary kiln; identify at least onevariable temperature region in the at least one infrared image of thepreheater level or rotary kiln based on a plurality of pixels in the atleast one subsequent infrared image of the preheater level or rotarykiln having a variable difference in temperature from a correspondingplurality of pixels in the at least one baseline infrared image of thepreheater level or rotary kiln, wherein the at least one variabletemperature region includes the plurality of pixels having a baselinetemperature and having a subsequent temperature that is the variabledistance in temperature; generate a visual representation of the atleast one variable temperature region of the preheater level or rotarykiln; and display the visual representation that identifies the presenceof the at least one variable temperature region in the fixed field ofview of the preheater level or rotary kiln.
 24. The system of claim 23,wherein the imaging analysis computer is configured to: determine aninput temperature of a gas input component of a first preheater level,wherein the gas input component fluidly couples the first preheaterlevel with the rotary kiln; generate a visual representation of theinput temperature; and provide the visual representation of the inputtemperature.
 25. The system of claim 23, wherein the imaging analysiscomputer is configured to: generate the visual representation to includeat least one of a 2D image, a 2D model, a 3D model, or graph showingtemperature data.
 26. The system of claim 23, wherein the imaginganalysis computer is configured to: implement a time difference betweenthe at least one baseline infrared image and the at least one subsequentinfrared image that is sufficient for a change in temperature of thepreheater level or rotary kiln to have the variable difference intemperature.
 27. The system of claim 23, wherein the imaging analysiscomputer is configured to: monitor any change in temperature of eachpixel of the subsequent infrared image of the preheater level and/orrotary kiln; compare any change in temperate of each pixel of the atleast one subsequent infrared image of the preheater level and/or rotarykiln with the respective pixel of the at least one baseline image of thepreheater level and/or rotary kiln; generate a visual representation ofany change in temperature of each pixel having the change intemperature; and display the visual representation of the change intemperature of each pixel having the change in temperature.
 28. Thesystem of claim 23, wherein the imaging analysis computer is configuredto: generate an alert that identifies the presence of the at least onevariable temperature region in the fixed field of view of the preheaterlevel and/or rotary kiln.
 29. The system of claim 23, wherein theimaging analysis computer is configured to: generate a data feed of realtime temperatures based on the at least one subsequent infrared image ofthe preheater level and/or rotary kiln; generate a data feed of realtime average temperatures based on the at least one baseline infraredimage and the at least one subsequent infrared image of the preheaterlevel and/or rotary kiln; generate a visual representation of the datafeed of real time temperatures and data feed of real time averagetemperatures; and provide the visual representation of the data feed ofreal time temperatures and data feed of real time average temperatures.30. The system of claim 23, wherein the imaging analysis computer isconfigured to: generate a graphical user interface that showstemperature data of the rotary kiln; generate a menu option of thegraphical user interface for selecting viewing of the temperature dataof the preheater level with or without being associated with thetemperature data of the rotary kiln; and display the graphical userinterface on a display.